1991
DOI: 10.12693/aphyspola.80.723
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Investigation of the Strains at ZnSe/GaAs Interfaces by Raman Scattering

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Cited by 4 publications
(2 citation statements)
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“…7) The simple and exact analytical dispersion relations obtained allow direct line-shape analysis of the experimental spectra and as a result permit high-accuracy non-destructive and contactless optical characterization of the electrical transport properties of semiconductors. 7) The unique approach since that time has been successfully applied to almost all of polar semiconductor compounds 8,9) including recently employed for GaN and related com-pounds [11][12][13] and currently, become a key metrology standard. The problem becomes more challenging as the device features shrink and tolerances become tighter, to the extent of their physical limits.…”
Section: Introductionmentioning
confidence: 99%
“…7) The simple and exact analytical dispersion relations obtained allow direct line-shape analysis of the experimental spectra and as a result permit high-accuracy non-destructive and contactless optical characterization of the electrical transport properties of semiconductors. 7) The unique approach since that time has been successfully applied to almost all of polar semiconductor compounds 8,9) including recently employed for GaN and related com-pounds [11][12][13] and currently, become a key metrology standard. The problem becomes more challenging as the device features shrink and tolerances become tighter, to the extent of their physical limits.…”
Section: Introductionmentioning
confidence: 99%
“…Ηv, 61.70.Wp Due to the lattice mismatch between the epilayer and the substrate in ZnSe/ZnO stuctures, it is cucial to know the limiting conditions leading to a pseudomorphic growth by the accommodation of the biaxial strains caused by difference in lattice constants and/or thermal expansion coefficients of the materials forming the heterostucture [1,2]. Moreover, hydrostatic pressure decreases the lattice constant of the materials.…”
mentioning
confidence: 99%