2022
DOI: 10.3390/met13010012
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Investigation of the Sn-0.7 wt.% Cu Solder Reacting with C194, Alloy 25, and C1990 HP Substrates

Abstract: Cu-based alloys are one of the most promising substrates to enhance the performance of lead-frame materials. In the present study, the interfacial reactions in the Sn-0.7 wt.% Cu (SC) lead-free solder reacting with Cu-3.3 wt.% Fe (C194), Cu-2.0 wt.% Be (Alloy 25), and Cu-3.3 wt.% Ti (C1990 HP) were investigated. The material underwent a liquid–solid interface reaction, and the reaction time was 0.5 to a few hours at the reaction temperatures of 240 °C, 255 °C, and 270 °C. The morphology, composition, growth ra… Show more

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Cited by 4 publications
(2 citation statements)
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“…However, the limited quantity of Ti present in C1990 HP did not induce any alteration in the phase. Additional discoveries indicate that the introduction of a small amount of Ti into Cu to create C1990 HP results in an amplified growth of the IMC and extensive spalling of the Cu 6 Sn 5 phase in the reaction couples of Sn/C1990 HP (Laksono et al , 2019, 2022a, 2022b), Sn-0.7 wt.% Cu/C1990 HP (Laksono et al , 2023) and Sn-3.0 wt.% Ag-0.5 wt.% Cu/C1990 HP (Yen et al , 2019a) during the liquid/solid reaction. The spalling phenomenon was observed to vary with changes in reaction time and temperature.…”
Section: Resultsmentioning
confidence: 99%
See 1 more Smart Citation
“…However, the limited quantity of Ti present in C1990 HP did not induce any alteration in the phase. Additional discoveries indicate that the introduction of a small amount of Ti into Cu to create C1990 HP results in an amplified growth of the IMC and extensive spalling of the Cu 6 Sn 5 phase in the reaction couples of Sn/C1990 HP (Laksono et al , 2019, 2022a, 2022b), Sn-0.7 wt.% Cu/C1990 HP (Laksono et al , 2023) and Sn-3.0 wt.% Ag-0.5 wt.% Cu/C1990 HP (Yen et al , 2019a) during the liquid/solid reaction. The spalling phenomenon was observed to vary with changes in reaction time and temperature.…”
Section: Resultsmentioning
confidence: 99%
“…Copper (Cu) is commonly used as a metallic coating material in printed circuit boards and is ideal for solder joint bonding due to its superior solderability (Yen et al, 2008;Laurila et al, 2005). To improve the reliability of a solder joint, various alloying elements are added to Cubased substrates to allow interfacial reactions to occur, as seen in our previous studies, such as Cu-Be (Yin et al, 2020b(Yin et al, , 2020cLi et al, 2021), Cu-Fe (Yin et al, 2020a) and Cu-Ti (Laksono et al, 2019;Wang et al, 2021;Laksono et al, 2022aLaksono et al, , 2022b. The addition of Ti to Cu reportedly confers conductive properties and good reliability (Soffa and Laughlin, 2004).…”
Section: Introductionmentioning
confidence: 99%