2015
DOI: 10.1134/s1063784215110067
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Investigation of the atomic, crystal, and domain structures of materials based on X-ray diffraction and absorption data: A review

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Cited by 16 publications
(5 citation statements)
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“…The phase composition of the samples was identified by the position of the reflection peaks. XRD θ-2θ curves were processed using the Scherrer method [20] to determine the characteristic size of the block in the direction perpendicular to the plane of epitaxial growth.…”
Section: Methodsmentioning
confidence: 99%
“…The phase composition of the samples was identified by the position of the reflection peaks. XRD θ-2θ curves were processed using the Scherrer method [20] to determine the characteristic size of the block in the direction perpendicular to the plane of epitaxial growth.…”
Section: Methodsmentioning
confidence: 99%
“…The Williamson−Hall model [8] for processing a set of reflections was applied to the obtained θ−2θ XRD curves. The FWHM values of reflection curves (denoted as ) are known to be defined by two dominating factors (crystallite sizes and micro-stresses) described by Gauss functions, which fit the registered curve on being convoluted.…”
Section: mentioning
confidence: 99%
“…The XRD data were recorded in the reflection mode. With such an experimental setup, the line positions of the diffraction reflection curves (DRC) provide information on the interplanar (and, possibly, interlayer) distance of the quasi-two-dimensional crystals [28]. In order to evaluate the synthesis reproducibility, the studies were performed on several samples obtained during the experiments at the various temperatures.…”
Section: X-ray Diffraction Analysis (Xrd)mentioning
confidence: 99%