2004
DOI: 10.1063/1.1765740
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Investigation of Pb(Zr,Ti)O3∕GaN heterostructures by scanning probe microscopy

Abstract: Piezoresponse force microscopy (PFM) technique has been utilized to study the evolution of domain structure with varying Pb(Zr,Ti)O3(PZT) thickness on GaN substrate. Sol-gel PZT films were deposited on the GaN∕sapphire substrate with PZT thickness of 100, 200, and 300nm. The films exhibit ferroelectric properties that vary as a function of the film thickness. This is explained by the mechanical stress at the PZT∕GaN interface. The thicker film (300nm) is characterized by the presence of a number of oppositely … Show more

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Cited by 37 publications
(21 citation statements)
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“…Integrating these oxides with wide bandgap polar semiconductors like GaN is of particular interest given the potential for both passive and active coupling between the fixed permanent semiconductor dipole and the reorientable ferroelectric dipole. In principle, ferroelectric-GaN interfaces are populated by large charge densities that must compensate the polarization discontinuity [2][3][4][5]. These charges are expected to form a 2-D electron or hole gas whose properties are determined by the polarization values and the interface separating the adjacent layers [6].…”
Section: Introductionmentioning
confidence: 99%
“…Integrating these oxides with wide bandgap polar semiconductors like GaN is of particular interest given the potential for both passive and active coupling between the fixed permanent semiconductor dipole and the reorientable ferroelectric dipole. In principle, ferroelectric-GaN interfaces are populated by large charge densities that must compensate the polarization discontinuity [2][3][4][5]. These charges are expected to form a 2-D electron or hole gas whose properties are determined by the polarization values and the interface separating the adjacent layers [6].…”
Section: Introductionmentioning
confidence: 99%
“…and the hysteretic and nonlinear E − P relation is specified by (5). As illustrated in Figure 3, the boundary conditions are defined by a zero displacement at x = 0 and the balance of forces between the piezoelectric actuator and the damped oscillator at x = L yields…”
Section: Structural Modelmentioning
confidence: 99%
“…Highly accurate nanopositioning control becomes increasingly important in applications such image steering devices [24], piezoresponse force microscopy [5], atomic manipulation [22], and protein delivery [23]. Often, piezoelectric materials are chosen as actuators in nanopositioning stages as well as embedded actuators within MEMS devices [24].…”
Section: Introductionmentioning
confidence: 99%
“…The focus on nanoscale material's research and device development continues to increase, highly accurate nanopositioning control becomes increasingly important in applications such image steering devices [6], nanoscale material characterization [7], atomic manipulation [8], and protein delivery [9]. Piezoelectric materials are often employed as actuators in nanopositioning stages as well as embedded actuators within MEMS devices [6].…”
Section: Performing Organization Name(s) and Address(es)mentioning
confidence: 99%