Investigation of neutron and proton SEU cross-sections on SRAMs between a few MeV and 50 MeV

Lambert, Damien; Desnoyers, Francois; Thouvenot, Didier

doi:10.1109/radecs.2009.5994571

Cited by 10 publications

(9 citation statements)

References 25 publications

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“…As can be seen, the 96 and 293 MeV neutron values are 27% and 5% larger than the saturation value, respectively; and therefore within the considered statistical uncertainty. This is compatible with the fact that in virtue of their similar nuclear reaction cross section protons and neutrons are expected to yield equivalent SEE cross sections above roughly 50 MeV [18,19].…”

Section: Ptb: Neutrons Between 5 and 15 Mevsupporting

confidence: 79%

Single Event Effect cross section calibration and application to quasi-monoenergetic and spallation facilities

Alía

Bonaldo

Brügger

et al. 2018

EPJ Nuclear Sci. Technol.

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Abstract. We describe an approach to calibrate Single Event Effect (SEE)-based detectors in monoenergetic fields and apply the resulting semi-empiric responses to more general mixed-field cases in which a broad variety of particle species and energy spectra are present. The calibration of the response functions is based both on experimental proton (30-200 MeV) and neutron (5-300 MeV) data and considerations derived from Monte Carlo simulations using the FLUKA Monte Carlo code. The application environments include the quasimonoenergetic neutrons at RCNP, the atmospheric-like VESUVIO spallation spectrum and the CHARM high-energy accelerator test facility. The agreement between the mixed-field response and that predicted through the mono-energetic calibration is within ±30% for the broad variety of cases considered and thus regarded as highly successful for mixed-field monitoring applications.

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Section: Ptb: Neutrons Between 5 and 15 Mevsupporting

confidence: 79%

Single Event Effect cross section calibration and application to quasi-monoenergetic and spallation facilities

Alía

Bonaldo

Brügger

et al. 2018

EPJ Nuclear Sci. Technol.

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“…The device simulations in Ref. 3 by D. Lambert also showed that this is true for the devices with 65, 90, 130 and 180 nm technology nodes. From Fig.…”

Section: Relative Cumulative Event Numbermentioning

confidence: 76%

“…Its height was set at 1 µm that is on the sensitive volume thickness scale. 3 Its radius was set at 10 µm that is much larger than the feature size of advanced nano-devices. In order to get the radial energy deposition distribution, the detector was divided into an innermost cylinder of radius 1 nm (much smaller than the feature size of advanced devices) and 43 concentric cylindrical shells of increasing thickness.…”

Section: Simulation Detailsmentioning

confidence: 99%

Characteristics of energy deposition from 1-1000 MeV proton and neutron induced nuclear reactions in silicon

Han

Guo

2017

AIP Advances

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The characteristics of the energy deposition of the secondary particles from the proton and neutron induced elastic and nonelastic reactions in silicon over a wide energy range of 1-1000 MeV, which are of great value for the proton and neutron single event effect (SEE) study, are investigated systematically in detail with Geant4 simulations. According to our simulation results, some important issues about the proton and neutron SEEs, including the energy dependence of the SEE cross sections, the equivalence of protons and neutrons in SEEs, the effects of the critical charge on SEEs, the geometric effect of the sensitive volumes, and the role of the elastic scattering mechanism in SEEs, are discussed. And some significant conclusions are tried to be drawn. With our systematic study, a comprehensive and profound understanding about the proton and neutron SEEs is reached from the physical perspective.

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“…For this purpose, we use technological information about the SRAM transistor technology in order to define the surface sensitive to the charge collection as that corresponding to an individual SRAM cell (∼10 µm 2 ). As to what regards the thickness of the SV, we consider 0.5 µm in line with what has been published in studies on similar technologies [16]. As we will later quantify, the variations of this parameter within reasonable margins do not have a significant impact on the simulation outcome.…”

Section: Seu Model Calibration and Benchmarkmentioning

confidence: 94%

Sub-LET Threshold SEE Cross Section Dependency With Ion Energy

Alía

Bahamonde

Brandenburg

et al. 2015

IEEE Trans. Nucl. Sci.

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This study focuses on the ion species and energy dependence of the heavy ion SEE cross section in the sub-LET threshold region through a set of experimental data. In addition, a Monte Carlo based model is introduced and applied, showing a good agreement with the data in the several hundred MeV/n range while evidencing large discrepancies with the measurements in the 10-30 MeV/n interval, notably for the Ne ion. Such discrepancies are carefully analyzed and discussed. Abstract-This study focuses on the ion species and energy dependence of the heavy ion SEE cross section in the sub-LET threshold region through a set of experimental data. In addition, a Monte Carlo based model is introduced and applied, showing a good agreement with the data in the several hundred MeV/n range while evidencing large discrepancies with the measurements in the 10-30 MeV/n interval, notably for the Ne ion. Such discrepancies are carefully analyzed and discussed.

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Investigation of neutron and proton SEU cross-sections on SRAMs between a few MeV and 50 MeV

Cited by 10 publications

References 25 publications

Single Event Effect cross section calibration and application to quasi-monoenergetic and spallation facilities

Single Event Effect cross section calibration and application to quasi-monoenergetic and spallation facilities

Characteristics of energy deposition from 1-1000 MeV proton and neutron induced nuclear reactions in silicon

Sub-LET Threshold SEE Cross Section Dependency With Ion Energy

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