2006
DOI: 10.1163/156856106779116588
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Investigation of moisture diffusion in electronic packages by molecular dynamics simulation

Abstract: Moisture-related failure is one of the main concerns in the integrated circuit (IC) package design. To minimize such failure in multi-layered electronic assemblies and packages, it is important to develop a better understanding of the reliability at a molecular level. In this paper, molecular dynamics (MD) simulations were conducted to investigate the respective moisture diffusion into the epoxy molding compound (EMC) and at the EMC/Cu interface. Moisture diffusion coefficients into the bulk EMC material and a… Show more

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Cited by 49 publications
(10 citation statements)
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“…These diffusional jumps lead over some time to a random walk of the molecules through the epoxy matrix. For Fickian diffusion in the limit of large times, the diffusion coefficient D can be obtained directly from the mean square displacement [17,18]:…”
Section: Mobility Of H 2 O In Epnmentioning
confidence: 99%
“…These diffusional jumps lead over some time to a random walk of the molecules through the epoxy matrix. For Fickian diffusion in the limit of large times, the diffusion coefficient D can be obtained directly from the mean square displacement [17,18]:…”
Section: Mobility Of H 2 O In Epnmentioning
confidence: 99%
“…IMC region in the presence of moisture and chlorine. At high humidity ambient, water vapor can penetrate into EMC and react with hydrolyzable chloride in EMC to produce Cl − ions [24,25]. Water and Cl − ions can diffuse and reach the Ag/Al interface and initiate the IMC corrosion.…”
Section: Resultsmentioning
confidence: 99%
“…7). As there are no standards, one might as well be inventive: Some interesting approaches are on the way (Schlottig et al 2009;Shirangi et al 2009a, b;Ernst et al 2008). Especially for interface test specimens preparation is of extreme importance.…”
Section: Delaminationmentioning
confidence: 99%