1997
DOI: 10.1016/s0169-4332(96)00904-x
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Investigation of metal/SiC interface using electron spectroscopy and scanning tunneling microscopy

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Cited by 6 publications
(1 citation statement)
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“…Ti was actually investigated on the Si-and C-face and ordered superstructures observed [147]. For Co, Ag and Ni more or less inhomogeneous films were reported with clustering of the thin metal layers [148,149,150]. The detailed atomic structure of the films could not be determined.…”
Section: Epitaxial Metal Filmsmentioning
confidence: 99%
“…Ti was actually investigated on the Si-and C-face and ordered superstructures observed [147]. For Co, Ag and Ni more or less inhomogeneous films were reported with clustering of the thin metal layers [148,149,150]. The detailed atomic structure of the films could not be determined.…”
Section: Epitaxial Metal Filmsmentioning
confidence: 99%