2008
DOI: 10.1016/j.tsf.2007.11.116
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Investigation of metal-oxide semiconductor field-effect transistor-like Si/SiO2/(nano)crystalline PbS heterostructures

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Cited by 5 publications
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“…It has been observed that the PbS film grows in highly uniform cubic structure on all of these electrodes after a critical thickness [29]. Gaiduk et al [35] and Stancu et al [36] have reported that the morphology and the thickness of the PbS layers strongly depend on the chemical nature of substrate studied. The XRD peak at 2Â = 35.74 • is attributed to SiC(1 0 2) structure [37].…”
Section: The Optical Absorption and Xrd Measurementsmentioning
confidence: 96%
“…It has been observed that the PbS film grows in highly uniform cubic structure on all of these electrodes after a critical thickness [29]. Gaiduk et al [35] and Stancu et al [36] have reported that the morphology and the thickness of the PbS layers strongly depend on the chemical nature of substrate studied. The XRD peak at 2Â = 35.74 • is attributed to SiC(1 0 2) structure [37].…”
Section: The Optical Absorption and Xrd Measurementsmentioning
confidence: 96%