2018
DOI: 10.1017/s1431927618001885
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Investigation of Electron Beam Deposition Parameters Within a Scanning Electron Microscope

Abstract: The proliferation of aberration-corrected microscopes has facilitated imaging and spectroscopy of structures at the atomic scale. This high-resolution information has both provided new capabilities for investigating spatial and structural information and highlighted the issues resulting from beam-specimen interactions. The high energy electrons and high current densities required to resolve such fine structures result in ionizing radiation that produces atomic rearrangements and chemical reactions within the s… Show more

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