2012
DOI: 10.1063/1.4711811
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Investigation of CuSb4Te2 alloy for high-speed phase change random access memory applications

Abstract: The thermal stability of amorphous Sb2Te film can be significantly improved by the addition of Cu. CuSb4Te2 alloy is considered to be a potential candidate for phase change random access memory (PCRAM), as evidenced by a higher crystallization temperature, a better data retention ability, and a faster switching speed in comparison with those of Ge2Sb2Te5. A reversible switching between set and reset states can be realized by an electric pulse as short as 7 ns for CuSb4Te2-based PCRAM cell. In addition, CuSb4Te… Show more

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Cited by 52 publications
(24 citation statements)
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“…5a shows the schematic crosssectional diagram of the PCRAM cell structure. Tungsten was used as a heating electrode 260 nm in diameter [23]. Figure 5a presents the measured current-voltage (I-V) curve of the PCRAM cell in current sweeping mode.…”
Section: Resultsmentioning
confidence: 99%
“…5a shows the schematic crosssectional diagram of the PCRAM cell structure. Tungsten was used as a heating electrode 260 nm in diameter [23]. Figure 5a presents the measured current-voltage (I-V) curve of the PCRAM cell in current sweeping mode.…”
Section: Resultsmentioning
confidence: 99%
“…However, the addition Ni into GST may lead to the formation of new covalent bonds with ionic tendency since the electronegativity of Ni (1.8) is lower than those of Sb (2.05) and Te (2.1) [17], and is expected to balance the two sides to achieve good properties.…”
Section: Introductionmentioning
confidence: 98%
“…In the usual way, doping other elements, such as Ge, Al, Cu, Ag, and In, etc. refs 16, 17, 18, 19, 20, into Sb-Te alloys can improve the thermal stability effectively. In recent years, Si has been chosen as a dopant due to its low cost and high efficiency.…”
mentioning
confidence: 99%