2020
DOI: 10.1088/1742-6596/1660/1/012055
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Investigation of Co-doped Cu2O thin films on the structural, optical and morphology by SPT

Abstract: Nanostructured copper oxide (Cu2O) and cobalt doped (Co:Cu2O)thin films were prepared at varying doping by spray pyrolysis technique(SPT). X-ray diffraction patterns investigate t structural properties. Surface topography was studied by using Atomic Force Microscopy (AFM). Transmittance spectra were determined by a UV-Vis spectrophotometer and the results showed that pure and Co doped Cu2O Nanostructures have a bandgap values between (2.56 - 2.85) eV.

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Cited by 13 publications
(2 citation statements)
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“…The presence of NH 3 molecules leads to an oxidation process on the surface. As specific O 2+ ions release bonded electrons to the surface, these electrons drift back to the conduction band [48], resulting in increased resistance and an enhanced potential barrier under these conditions [49]. Furthermore, it was observed that the TiO 2 film at 4% Ag doping exhibited the highest resistance.…”
Section: Resultsmentioning
confidence: 99%
“…The presence of NH 3 molecules leads to an oxidation process on the surface. As specific O 2+ ions release bonded electrons to the surface, these electrons drift back to the conduction band [48], resulting in increased resistance and an enhanced potential barrier under these conditions [49]. Furthermore, it was observed that the TiO 2 film at 4% Ag doping exhibited the highest resistance.…”
Section: Resultsmentioning
confidence: 99%
“…Similarly, at −1.0 V, a significant peak is evident at 42.7 planes, providing insights into the preferential growth directions of the crystals. The crystallite size of the prepared Cu 2 O thin films is determined using the Scherrer formula, which takes into account the XRD peaks' full width at half maximum (FWHM) [50].…”
Section: X-ray Diffraction Analysismentioning
confidence: 99%