2009
DOI: 10.1016/j.apsusc.2009.07.005
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Investigation by EELS and TRIM simulation method of the interaction of Ar+ and N+ ions with the InP compound

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Cited by 6 publications
(3 citation statements)
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“…Figure 1 shows the resulting concentration profiles of nitrogen and carbon correlated with their mathematical models from the simulation programs. The simulated concentration profiles of carbon were determined by the TRIDYN code [14], and the simulated concentration profiles of nitrogen were determined by the SRIM code [15]. The correspondence between the measured and calculated depth profiles of the carbon distribution is very good.…”
Section: Resultsmentioning
confidence: 99%
“…Figure 1 shows the resulting concentration profiles of nitrogen and carbon correlated with their mathematical models from the simulation programs. The simulated concentration profiles of carbon were determined by the TRIDYN code [14], and the simulated concentration profiles of nitrogen were determined by the SRIM code [15]. The correspondence between the measured and calculated depth profiles of the carbon distribution is very good.…”
Section: Resultsmentioning
confidence: 99%
“…The interaction process ions-matter occurred first with the outmost layers of the target which corresponds to the first peak. The interpretation of TRIM spectra is particularly based on the second peak of TRIM spectrum which corresponds to the creation of vacancies at this disturbed depth [24]. Figure 6 is given as an example.…”
Section: Simulation Methods Trimmentioning
confidence: 99%
“…For p-InP surface, type inversion has also been reported [24,25]. Recently, electron energy loss spectroscopy (EELS) has been used to investigate the interactions between the low energy Ar + (N + ) ions and the InP compound [26]. The InP surface is extremely sensitive to Ar + ions bombardment.…”
Section: Introductionmentioning
confidence: 99%