Abstract:More recently aluminum doped zinc oxide (ZnO:Al) thin films have attracted a lot of attention as an alternative to indium tin oxide (ITO) for optoelectronic devices in order to produce energy such as solar cells. In this work, ZnO:Al thin films were deposited onto quartz and silicon substrates by RF magnetron sputtering technique and the effect of Al doping on structural, optical and sensing properties of the films were studied. The dopant concentration was varied between 1 wt.% and 3 wt.% in the thin films. T… Show more
“…Aluminum-doped zinc oxide (AZO) thin films, an n-type semiconductor with a hexagonal wurtzite crystal structure, have attracted noteworthy interest from the researcher because of their distinctive optical and electrical properties with a wide range of applications and good stability. It is a non-toxic, lower-cost, and sustainable alternative to using as transparent conductive oxide (TCO) or an electron-transport layer (ETL) in applications for optoelectronic devices [1], and a coating layer for UV sensors [2], gas sensors [3], and heaters [4]. Various methods such as RF-sputtering [1][2][3][4], sol-gel dip coating [5,6], pulse laser deposition [7,8], and atomic layer deposition [9] have been used to prepare the AZO thin film on both a glass and flexible substrates.…”
Section: Introductionmentioning
confidence: 99%
“…It is a non-toxic, lower-cost, and sustainable alternative to using as transparent conductive oxide (TCO) or an electron-transport layer (ETL) in applications for optoelectronic devices [1], and a coating layer for UV sensors [2], gas sensors [3], and heaters [4]. Various methods such as RF-sputtering [1][2][3][4], sol-gel dip coating [5,6], pulse laser deposition [7,8], and atomic layer deposition [9] have been used to prepare the AZO thin film on both a glass and flexible substrates. Sputtering parameters such as power [10][11][12][13][14][15][16], pressure [11,12], and temperature [14] with substrate temperature [11,17] and substrate roughness [18] were important keys that have been intensively investigated to improve the optical and electrical properties of the AZO films.…”
The electrical and optical properties of sputtered Al-doped ZnO films prepared on a glass substrate with different thicknesses (97, 127, 161, 211, and 276 nm) were systematically investigated. The 97 nm film showed only the main peak of the AZO (002) phase, whereas the rest films exhibited AZO (002) and (004) phases, and the peak intensities were obviously increased with increasing thickness. The films displayed a granular grain surface and columnar-like structure with different sizes and distributions depending on film thickness.
Surface roughness was increased, whereas the electrical resistance was decreased with increasing film thickness. The smallest crystallite size of about 26 nm with the highest resistivity and lowest carrier concentration was observed on a 127 nm film, whereas the crystallite size of about 29 nm was observed on the 97, 161, 211, and 276 nm films. All
AZO films exhibited good electrical properties and transparency with an averaged optical transmittance higher than 80% in the visible wavelength. The 162 nm film showed the highest transmittance of 86% in the wavelength range of 350-900 nm and a wide energy band gap of
3.52 eV because of the highest mobility and crystallite size with a columnar structure and random size distribution. The figure of merit (FOM) was strongly related to the optical band gap and tended to increase with increasing thickness. The results are attributed that the optical energy band gap was altered by film thickness by improving phase structure and surface morphology.
“…Aluminum-doped zinc oxide (AZO) thin films, an n-type semiconductor with a hexagonal wurtzite crystal structure, have attracted noteworthy interest from the researcher because of their distinctive optical and electrical properties with a wide range of applications and good stability. It is a non-toxic, lower-cost, and sustainable alternative to using as transparent conductive oxide (TCO) or an electron-transport layer (ETL) in applications for optoelectronic devices [1], and a coating layer for UV sensors [2], gas sensors [3], and heaters [4]. Various methods such as RF-sputtering [1][2][3][4], sol-gel dip coating [5,6], pulse laser deposition [7,8], and atomic layer deposition [9] have been used to prepare the AZO thin film on both a glass and flexible substrates.…”
Section: Introductionmentioning
confidence: 99%
“…It is a non-toxic, lower-cost, and sustainable alternative to using as transparent conductive oxide (TCO) or an electron-transport layer (ETL) in applications for optoelectronic devices [1], and a coating layer for UV sensors [2], gas sensors [3], and heaters [4]. Various methods such as RF-sputtering [1][2][3][4], sol-gel dip coating [5,6], pulse laser deposition [7,8], and atomic layer deposition [9] have been used to prepare the AZO thin film on both a glass and flexible substrates. Sputtering parameters such as power [10][11][12][13][14][15][16], pressure [11,12], and temperature [14] with substrate temperature [11,17] and substrate roughness [18] were important keys that have been intensively investigated to improve the optical and electrical properties of the AZO films.…”
The electrical and optical properties of sputtered Al-doped ZnO films prepared on a glass substrate with different thicknesses (97, 127, 161, 211, and 276 nm) were systematically investigated. The 97 nm film showed only the main peak of the AZO (002) phase, whereas the rest films exhibited AZO (002) and (004) phases, and the peak intensities were obviously increased with increasing thickness. The films displayed a granular grain surface and columnar-like structure with different sizes and distributions depending on film thickness.
Surface roughness was increased, whereas the electrical resistance was decreased with increasing film thickness. The smallest crystallite size of about 26 nm with the highest resistivity and lowest carrier concentration was observed on a 127 nm film, whereas the crystallite size of about 29 nm was observed on the 97, 161, 211, and 276 nm films. All
AZO films exhibited good electrical properties and transparency with an averaged optical transmittance higher than 80% in the visible wavelength. The 162 nm film showed the highest transmittance of 86% in the wavelength range of 350-900 nm and a wide energy band gap of
3.52 eV because of the highest mobility and crystallite size with a columnar structure and random size distribution. The figure of merit (FOM) was strongly related to the optical band gap and tended to increase with increasing thickness. The results are attributed that the optical energy band gap was altered by film thickness by improving phase structure and surface morphology.
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