2014
DOI: 10.1063/1.4891858
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Inversion layer on the Ge(001) surface from the four-probe conductance measurements

Abstract: Electronic effects induced by single hydrogen atoms on the Ge(001) surfaceUse of near-surface channel conductance and differential capacitance versus potential measurements to correlate inversion layer formation with low effective surface recombination velocities at n-Si/liquid contacts Appl.A four-point surface conductivity probe suitable for in situ ultrahigh vacuum conductivity measurements Rev.

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Cited by 17 publications
(46 citation statements)
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“…In the case of three-dimensional currents the results depend on the absolute distances between electrodes. The experimental points closely reproduced the relevant scaling laws 7 . Here we report on resistance measurements for Ge(001):H in the same experimental settings as in Ref.…”
Section: A Resistance Analysissupporting
confidence: 61%
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“…In the case of three-dimensional currents the results depend on the absolute distances between electrodes. The experimental points closely reproduced the relevant scaling laws 7 . Here we report on resistance measurements for Ge(001):H in the same experimental settings as in Ref.…”
Section: A Resistance Analysissupporting
confidence: 61%
“…We remark that the insensitivity of the SFL to passivation explains conductance measurements in the same way as in Ref. 7. Indeed, the inversion layer is not destroyed by hydrogen adsorption.…”
Section: B Scanning Tunneling Spectroscopy and Microscopy Datasupporting
confidence: 49%
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