Intracavity iodine cell spectroscopy with an extended-cavity laser diode around 633 nm

Zarka, A.; Chartier, J. M.; Aman, J.; Jaatinen, Esa

doi:10.1109/19.571798

Cited by 23 publications

(15 citation statements)

References 4 publications

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“…At the Istituto Nazionale di Ricerca Metrologica an externalcavity diode 3 , whose lasing-mode frequency is stabilized against an 127 I 2 He-Ne reference laser, is going to be used to measure the Si lattice parameter by combined x-ray and optical interferometry. The presence of lasing side modes has been investigated by beating the free-running diode beam against the radiation of the He-Ne laser.…”

Section: Application Examplementioning

confidence: 99%

“…Stabilized external-cavity diode lasers [1][2][3][4] are efficient and compact light sources which are used for applications in precision dimensional measurements by laser interferometry; their relatively sharp linewidth (some hundreds of kHz), high power (few mW) and wide tunable range (up to tens of GHz) are particularly attractive [5,6].…”

Section: Introductionmentioning

confidence: 99%

See 1 more Smart Citation

On the effect of broadband emission in external-cavity diode-laser interferometry

Galzerano¹,

Mana²,

Massa³

2007

Meas. Sci. Technol.

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When external-cavity diode lasers are used in dimensional metrology via optical interferometry, parasitic modes and background radiation deserve careful investigation. This paper gives the relevant measurement equation and explicit formulae for the excess phase of travelling fringes. Particular emphasis is given to potential errors in the measurement of the Si lattice parameter by combined x-ray and optical interferometry.

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Section: Application Examplementioning

confidence: 99%

Section: Introductionmentioning

confidence: 99%

On the effect of broadband emission in external-cavity diode-laser interferometry

Galzerano¹,

Mana²,

Massa³

2007

Meas. Sci. Technol.

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“…However, it requires no initial value for the optical path difference and the interferometer mirror does not have to be scanned. Future work is required to make the extended sweep faster and to develop the technique at ≈630 nm, with diode lasers frequency-stabilized to iodine [24][25][26]. This will enable this laser measurement technique to be used as a direct replacement for fixed-frequency HeNe lasers using HeNe optics, in cases where this method provides advantage as a length metrology tool.…”

Section: Conclusion and Future Developments In Swept-frequency Interf...mentioning

confidence: 99%

High-accuracy length metrology using multiple-stage swept-frequency interferometry with laser diodes

Barwood¹,

Gill²,

Rowley³

1998

Meas. Sci. Technol.

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The optical length of a 1 m Fabry-Pérot etalon has been determined by swept-frequency interferometry using laser diodes. The method involves progressively building up the measurement accuracy using frequency sweeps over increasing ranges, from 150 MHz (one optical fringe) to 19 GHz and 7 THz. The 7 THz sweep is referenced to the splitting of the rubidium D lines at 780 nm and 795 nm. The result from the 7 THz sweep is sufficiently accurate to use the known frequency of either end point of the scan to determine the length to a few parts in , without the need for any further measurement. The scope for further development of this technique to a range of interferometric systems is discussed.

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“…One approach-to use simple optical elements ͑such as gratings, etalons, and mirrors͒ to feed some of its output power back to the diode laser-has been widely adopted because it does not require any modification of the commercial diode laser. 5,6 Another one-external-cavity feedback 7,8 -is to use strong feedback in combination with an antireflection ͑AR͒ coating on one face of the diode. Much work has been done on external-cavity diode lasers at wavelengths 633 nm, 670 nm, 1.3 m, 1.5 m, and 780 nm.…”

Section: Introductionmentioning

confidence: 99%

633-nm tunable external-cavity diode laser with an intracavity glass plate as the fine-tuning device

Chao

Yin

et al. 2001

Opt. Eng

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The application of beatwave Fabry-Perot interferometers (BFPIs) to nonlinearity error calibration is limited by the short tuning range of the slave He-Ne laser. In this paper, a 633-nm tunable externalcavity diode laser (ECL) is proposed as the slave laser of a BFPI. The ECL consists of an antireflection-coated quantum-well laser diode, a collimating lens, and a diffraction grating in Littrow configuration. In addition, an intracavity glass plate is adopted to provide cavity fine tuning, which makes the ECL more convenient, as it is easier to align the light in the cavity. At an optical length of 45 mm, a coarse-tuning range of 4 nm around 633 nm is obtained by rotating the grating. It is also demonstrated that this ECL can operate in a single-mode regime and can be continuously tuned over a frequency range of 1.8 GHz by tilting the intracavity glass plate.

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Intracavity iodine cell spectroscopy with an extended-cavity laser diode around 633 nm

Cited by 23 publications

References 4 publications

On the effect of broadband emission in external-cavity diode-laser interferometry

On the effect of broadband emission in external-cavity diode-laser interferometry

High-accuracy length metrology using multiple-stage swept-frequency interferometry with laser diodes

633-nm tunable external-cavity diode laser with an intracavity glass plate as the fine-tuning device

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