2017
DOI: 10.1016/j.optlaseng.2016.10.011
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Interferometric phase microscopy using slightly-off-axis reflective point diffraction interferometer

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Cited by 20 publications
(15 citation statements)
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“…We can see that the results suffer from ambiguities in single wavelength images, but free-ambiguities in double-wavelength images. From the difference of both averages [26,30] of the line λ s in figure 4, we can calculate the step height as 2021.2 nm, which agrees well with the nominal height. Undeniably, the phase noise increases due to the phase difference.…”
Section: Resultssupporting
confidence: 73%
“…We can see that the results suffer from ambiguities in single wavelength images, but free-ambiguities in double-wavelength images. From the difference of both averages [26,30] of the line λ s in figure 4, we can calculate the step height as 2021.2 nm, which agrees well with the nominal height. Undeniably, the phase noise increases due to the phase difference.…”
Section: Resultssupporting
confidence: 73%
“…To demonstrate the feasibility of nFPRM, we first imaged a phase plate by using off-axis DH microscopy using a reflective point diffraction interferometer [20]. In the experiments, we used an He-Ne laser with λ = 632.8 nm as a light source and a CCD camera ---------------------atan = with a resolution of 1600 × 1200 pixels as a recorder, where each pixel had an area of 4.4 × 4.4 μm.…”
Section: Resultsmentioning
confidence: 99%
“…To realize phase shifting, a Wollaston prism or a special cube beam-splitter was also utilized [8][9][10]. Some other commonpath SODHs with long-term stability and high robustness have also been proposed using polarization phase-shifting technique [11][12][13][14]. However, all of these methods acquire phase shift using polarization technique or special prisms.…”
Section: Introductionmentioning
confidence: 99%
“…Besides the experimental setup, another key point in SODH is to develop efficient algorithms with simpler processes and high reconstruction capability. The first author has realized a fast phase retrieval method in SODH based on specimen-free holograms captured by a prior measurement without any specimen [14], and it can be further sped up with spectrum cropping and multiplexing techniques [19]. However, the methods were only demonstrated on thin phase specimens.…”
Section: Introductionmentioning
confidence: 99%
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