Interfacial wave velocity of vertical gas-liquid annular flow at different system pressures

Wang, Chao; Zhao, Ning; Yue, Fangxin; Sun, Hongjun; Fang, Luyuan

doi:10.1016/j.expthermflusci.2017.09.007

Cited by 27 publications

(12 citation statements)

References 38 publications

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“…The liquid film thickness parameter is a key factor in the calculation of the pressure drop, void fraction, and interfacial shear parameters [6][7][8][9]. The interface waves between the liquid film and the gas core mainly consist of disturbance waves and ripple waves [8][9][10][11][12], which are affected by interfacial shear and liquid inertia forces [3,6]. Owing to the increase in the gas core density induced by entrainment, the interface shear force increases and the interface wave morphology becomes more complex, which makes it difficult to effectively predict the liquid film thickness.…”

Section: Introductionmentioning

confidence: 99%

“…LIF and PIV need to place tracer into the measurement medium, and the laser has high requirements for the environment and radiation protection, which can only be used for experimental research in the laboratory and cannot be applied in the industrial field [26]. The near infrared (NIR) absorption method is to a point liquid film measurement method, with high time and space resolution [12].…”

Section: Introductionmentioning

confidence: 99%

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Liquid film characteristics measurement based on NIR in gas–liquid vertical annular upward flow

Zhao

Wang

Wang³

et al. 2022

Meas. Sci. Technol.

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Liquid film plays a crucial role in void fraction, friction pressure drops, the momentum and heat transfer in the two-phases flow. The film thickness measurement experiments of annular flow at four pressure conditions have been conducted by near infrared (NIR) sensor. The signal is processed by variational mode decomposition (VMD), of which parameters are optimized by sparrow search algorithm (SSA). Envelope spectrum and Pearson correlation coefficient (PCC) judgment criteria is adopted for signal reconstruction, and the value of liquid film thickness is obtained. The effect (Such as flow rate, pressure, entrainment, etc) of liquid film thickness are analyzed theoretically. The characterization parameters Weg”, Wel, Nμl and Xmod have been extracted and optimized, and then a new average liquid film thickness correlation is proposed. The laboratory results indicate that mean absolute percentage error (MAPE) of the predictive correlation is 4.35% (current data) and 12.02% (literatures’ data) respectively.

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Section: Introductionmentioning

confidence: 99%

Section: Introductionmentioning

confidence: 99%

Liquid film characteristics measurement based on NIR in gas–liquid vertical annular upward flow

Zhao

Wang

Wang³

et al. 2022

Meas. Sci. Technol.

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“…Berna et al [4] and Ju et al [5] used published data and proposed a new correlation of disturbance wave velocity in their respective work. Wang et al [6] proposed an improved disturbance wave velocity correlation in their work, which takes into account the influence of pressure. Ju et al [7] deduced the relation between the disturbance wave velocity and the wall shear stress and fitted the correlation of the wall shear stress by using the public data.…”

Section: Introductionmentioning

confidence: 99%

Studying Disturbance Wave Velocity and Wall Shear Stress of Vertical Upward Annular Flow in Narrow Rectangular Channel

Liu

Yan

Zhu

et al. 2021

Science and Technology of Nuclear Installations

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As two important parameters, the velocity of disturbance wave and the wall shear stress in annular flow are very important to solve the closed equations of the mechanical model for annular flow. In this study, the disturbance wave velocity and wall shear stress of annular flow in a vertical narrow rectangular channel with a cross section of 70 mm × 2 mm were studied. According to the experimental results, it is found that the wave velocity and wall shear stress of disturbance wave increase with increasing gas phase velocity and liquid phase velocity. Also, existing correlations for predicting the velocity of disturbance wave were summarized and evaluated using the current experimental data. A new correlation for wall shear stress based on the disturbance wave velocity has been proposed. Compared with the existing correlation for predicting wall shear stress, this new correlation can well predict the current experimental data and MAPE is only 7.32%.

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“…Localised and point methods differ as localised methods perform measurements over a defined spatial region whereas point methods perform measurements at a single spatial location. Different sensors methods have been used to study film thickness and disturbance waves including a variety of optical techniques [6,7,[10][11][12][13][14][15], conductance or capacitance sensors techniques [16,17], ultrasonic methods [18] or those that place tracer materials (often radioactive) within the fluid [19] Results from previous experimental work has shown that these different measurements can successfully be used to characterise the film and disturbance wave features in annular flow. Zadrazil et al [10] showed that planar laser induced florescence measurements could be used to measure the frequency and amplitude of disturbance waves in upward annular flow.…”

Section: Introductionmentioning

confidence: 99%

“…Vasques et al [9] studied upward and downward gas/liquid annular flow and used measurements from a brightness based laser induced florescence technique to demonstrate that the disturbance wave behaviour was dependent on flow direction. Wang et al [14] used Near-Infrared measurements at two points to study the velocity of disturbance waves at different gas pressures in vertical upwards gas/liquid flow. Belt [17] used conductance probes at 32 circumferential locations and 10 axial locations to study disturbance wave features in upward gas liquid annular flow.…”

Section: Introductionmentioning

confidence: 99%

Thin film thickness measurements in two phase annular flows using ultrasonic pulse echo techniques

Al-Aufi

Hewakandamby

Dimitrakis

et al. 2019

Flow Measurement and Instrumentation

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The electric power generation and oil/gas production industries have a strong interest in the physical characterization of conducting and non-conducting liquid films that are formed during the flow of liquids in pipes. Conducting and non-conducting liquid films do not lend themselves to the same characterization techniques due to the different requirements originating from their electrical properties. Techniques based on the use of ultrasound are extremely attractive for that purpose as they do not depend on the electrical properties of the liquid and are also non-invasive. This paper presents the application of ultrasonic techniques for measuring the thickness of wavy thin liquid films (<6 mm) in vertical pipes. Initial benchtop experiments were performed, and different signal processing methods were implemented in order to identify the most suitable depending on the film thickness. For a film thickness >0.5 mm a time of flight method was utilized whereas for a film thicknesses <0.5 mm a frequency method and time domain method were utilized. These methods were validated using a theoretical volume measurement on a static system. The studied methods were then tested on downward and upward vertical flow experimental rigs with pipe diameters of 127mm and 34.5mm respectively. The results of the experiments using ultrasonic methods showed good agreement with the measurements obtained using a multi pin film sensor and a concentric conductance probe, highlighting the potential that ultrasound offers in thin film measurements.

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Interfacial wave velocity of vertical gas-liquid annular flow at different system pressures

Cited by 27 publications

References 38 publications

Liquid film characteristics measurement based on NIR in gas–liquid vertical annular upward flow

Liquid film characteristics measurement based on NIR in gas–liquid vertical annular upward flow

Studying Disturbance Wave Velocity and Wall Shear Stress of Vertical Upward Annular Flow in Narrow Rectangular Channel

Thin film thickness measurements in two phase annular flows using ultrasonic pulse echo techniques

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