“…In previously published papers, the interface reaction layer between the solder and the substrate has generally been investigated by a combination of microstructural analysis using SEM, chemical composition analysis using energy dispersive X-ray spectroscopy (EDS), and phase analysis using X-ray diffraction (XRD) in conjunction with phase diagrams (Chen et al, 2006;Song et al, 2006;Chen et al, 2008;Takaku et al, 2008;Hui et al, 2009;Kim et al, 2009aKim et al, , 2009bHaque et al, 2010aHaque et al, , 2010bMahmudi & Eslami, 2010;Shi et al, 2010;Takahashi et al, 2010;Haque et al, 2012;Iseki & Takamori, 2012;Wang et al, 2012). However, SEM and EDS analysis cannot yield accurate results because of technical limitations such as low spatial resolution (large electron beam-specimen interaction volume) and ambiguous peaks and noise signals.…”