2008
DOI: 10.1016/j.matchemphys.2008.04.018
|View full text |Cite
|
Sign up to set email alerts
|

Interfacial reactions in the Sn–Sb/Ag and Sn–Sb/Cu couples

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
2
1
1
1

Citation Types

4
21
0

Year Published

2009
2009
2023
2023

Publication Types

Select...
8
1

Relationship

1
8

Authors

Journals

citations
Cited by 33 publications
(25 citation statements)
references
References 8 publications
4
21
0
Order By: Relevance
“…4,6,7,[21][22][23][24][25] In the DSC measurements with Cu, Ni, and Ag substrates, the compositions of the molten solders will change due to the intake of the substrate element during the heating and cooling processes. The equilibrium solidification temperature changes as well if the composition changes.…”
Section: Resultsmentioning
confidence: 99%
“…4,6,7,[21][22][23][24][25] In the DSC measurements with Cu, Ni, and Ag substrates, the compositions of the molten solders will change due to the intake of the substrate element during the heating and cooling processes. The equilibrium solidification temperature changes as well if the composition changes.…”
Section: Resultsmentioning
confidence: 99%
“…Further, NiBi 3 and NiBi phases were reportedly formed during connection with a Ni substrate (formation of the interface reaction layer differs depending on the Ag composition of Bi-Ag solders) (Song et al, 2006;Shi et al, 2010;Iseki & Takamori, 2012). In the case of Sn-based solder alloys, Cu 3 Sn and Ni 3 Sn 4 IMCs were reportedly formed when the solder joined with Cu and Ni substrates (Chen et al, 2006(Chen et al, , 2008. As summarized in Table 2, the number of papers that have studied the interface reaction layer is still small, and the research results consist only of simple phase analysis using …”
Section: Interfacial Reaction Between High-temperature Pb-free Soldermentioning
confidence: 99%
“…In previously published papers, the interface reaction layer between the solder and the substrate has generally been investigated by a combination of microstructural analysis using SEM, chemical composition analysis using energy dispersive X-ray spectroscopy (EDS), and phase analysis using X-ray diffraction (XRD) in conjunction with phase diagrams (Chen et al, 2006;Song et al, 2006;Chen et al, 2008;Takaku et al, 2008;Hui et al, 2009;Kim et al, 2009aKim et al, , 2009bHaque et al, 2010aHaque et al, , 2010bMahmudi & Eslami, 2010;Shi et al, 2010;Takahashi et al, 2010;Haque et al, 2012;Iseki & Takamori, 2012;Wang et al, 2012). However, SEM and EDS analysis cannot yield accurate results because of technical limitations such as low spatial resolution (large electron beam-specimen interaction volume) and ambiguous peaks and noise signals.…”
Section: Need For Transmission Electron Microscopy Analysismentioning
confidence: 99%
“…In 2007, the European Union funded the COST MP 602 Action to find suitable lead-free substitutes for high temperature solders. One of the possibilities is represented by Sn-Sb and Sn-Sb-Cu based alloys as potential replacements of high-Pb solders [3,4]. Jang et al [5] report soldering behaviour of lead--free SnSb alloys on Cu foils and phased-in Cu-Cr thin film.…”
Section: Introductionmentioning
confidence: 99%