Interfacial perfection for pushing InGaAs and Ge MOS device limits (invited)

Hong, M.; Lin, Yan-Ting; Wan, Hsien-Wen; Chen, W. S.; Cheng, Yi-Ting; Cheng, Chia-Ming; Pi, Tun‐Wen; Kwo, J.

doi:10.1109/icsict.2018.8564962

2018 14th IEEE International Conference on Solid-State and Integrated Circuit Technology (ICSICT) 2018

DOI: 10.1109/icsict.2018.8564962

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Interfacial perfection for pushing InGaAs and Ge MOS device limits (invited)

M. Hong

Yan-Ting Lin

Hsien-Wen Wan

et al.

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Interfacial perfection for pushing InGaAs and Ge MOS device limits (invited)

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