2010
DOI: 10.1063/1.3291666
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Interfacial intermixing in InAs/GaSb short-period-superlattices grown by molecular beam epitaxy

Abstract: The unique properties of the noncommon-atom InAs/GaSb short-period-superlattices (SPSL) strongly depend on the interface structure. These interfaces are characterized using transmission electron microscopy (TEM). The compositional sharpness is obtained from the comparison of the experimental contrast in g002 two-beam dark-field TEM images with simulated intensity profiles, which are calculated assuming that the element distribution profiles are described by sigmoidal functions. The interfacial intermixing, def… Show more

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Cited by 49 publications
(43 citation statements)
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“…Recently Hulko et al [2,3] and Luna et al [4][5][6] have shown empirically that experimental concentration profiles in III-V two-dimensional (2D) heterostructures, e.g. quantum wells (QW) grown by molecular beam epitaxy (MBE), can be accurately reproduced by a sigmoidal function of the form x(z) = x 0 /[1 + exp(−z/L)].…”
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confidence: 99%
“…Recently Hulko et al [2,3] and Luna et al [4][5][6] have shown empirically that experimental concentration profiles in III-V two-dimensional (2D) heterostructures, e.g. quantum wells (QW) grown by molecular beam epitaxy (MBE), can be accurately reproduced by a sigmoidal function of the form x(z) = x 0 /[1 + exp(−z/L)].…”
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confidence: 99%
“…4(b), both As and In atom fractions decrease gradually from NW core to shell edge. The growth conditions of core/shell NWs have not been optimized so that the interface between core and shell layers is not very sharp [38][39][40]. Secondly, InAs surface may decompose durinig the cooling step before the GaSb growth.…”
Section: Fig 1(a) Shows An Sem Image Of Inas Nws Grown In the Verticalmentioning
confidence: 98%
“…As already reported in Ref. 12, qDFTEM analysis of the chemical interface in NCA heterostructures relies on the analysis of two-beam DFTEM images obtained with the diffraction vector g ¼ 002, which is sensitive to the chemical composition for semiconductors with zincblende structure. In short, the method is based on the proposal of a distribution profile for the different constituent elements that we put into the calculation of the corresponding diffracted intensity under kinematic conditions (I 002 ).…”
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confidence: 99%
“…Based on the analysis of the intensity contrast of g 002 dark-field transmission electron microcopy (DFTEM) micrographs, Luna and co-workers have recently proposed a method for the quantitative evaluation of the chemical intermixing at the interfaces of InAs/GaSb superlattices, which includes segregation effects. 12 The procedure, however, has not yet been applied to the analysis of the chemical interface in nanostructures, e.g., across QDs per se or across WLs. In this work, we apply our quantitative DFTEM (qDFTEM) method to the chemical characterization of the interface in a Sb-based non-commonatom (NCA) WL.…”
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confidence: 99%