2019
DOI: 10.1016/j.solener.2019.07.097
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Interface studies by simulation on methylammonium lead iodide based planar perovskite solar cells for high efficiency

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Cited by 29 publications
(5 citation statements)
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“…As shown in Figure 9 (a), V OC is constant and independent of carrier concentration, which indicates that there are very few minority carriers in the HTL as photogenerated electrons in the absorber layer are effectively blocked by the sufficiently high potential formed by the high CBO at the HTL/WSe 2 interface, see Figure 3 (b). This finding also confirms that due to favorable band alignment at the HTL/absorber interface, Cu 2 O:N HTL effectively blocks electrons and only accepts holes from the absorber [ 82 ] (see Figure 3 (b)). Between lightly-doped and highly-doped HTL, the main differences in cell performance are the J SC and FF.…”
Section: Resultssupporting
confidence: 73%
“…As shown in Figure 9 (a), V OC is constant and independent of carrier concentration, which indicates that there are very few minority carriers in the HTL as photogenerated electrons in the absorber layer are effectively blocked by the sufficiently high potential formed by the high CBO at the HTL/WSe 2 interface, see Figure 3 (b). This finding also confirms that due to favorable band alignment at the HTL/absorber interface, Cu 2 O:N HTL effectively blocks electrons and only accepts holes from the absorber [ 82 ] (see Figure 3 (b)). Between lightly-doped and highly-doped HTL, the main differences in cell performance are the J SC and FF.…”
Section: Resultssupporting
confidence: 73%
“…parameters for the materials are defined in the simulation and reported elsewhere. 19 In the absorption layer, Gaussian-like distribution is more appropriate to describe the defect states. 20 Defects are located 0.6 eV above the top of the valance band with a density of 1 9 10 17 /cm 3 ; characteristic energy of 0.1 eV is considered, and the electron and hole capture cross section is set to 1 9 10 14 /cm 2 .…”
Section: Device Structure and Simulation Detailsmentioning
confidence: 99%
“…The movement of the charge carriers depends on the electric field at the interface of the absorber. Employing ETLs and HTLs in the device provides an additional mechanism to enhance carrier collection by functioning as blocking layers for electrons and holes . The EB discontinuity at interfaces ETL/absorber and absorber/HTL can result in interfacial recombination, which directly affects the device efficiency.…”
Section: Resultsmentioning
confidence: 99%