2014
DOI: 10.1039/c4ee00168k
|View full text |Cite
|
Sign up to set email alerts
|

Interface energetics in organo-metal halide perovskite-based photovoltaic cells

Abstract: Direct and inverse photoemission spectroscopies are used to determine materials electronic structure and energy level alignment in hybrid organic-inorganic perovskite layers grown on TiO 2 . The results provide a quantitative basis for the analysis of perovskite-based solar cell performance and choice of an optimal hole-extraction layer.

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
3
1

Citation Types

85
706
6
2

Year Published

2015
2015
2023
2023

Publication Types

Select...
5
2

Relationship

1
6

Authors

Journals

citations
Cited by 632 publications
(799 citation statements)
references
References 21 publications
85
706
6
2
Order By: Relevance
“…In this method, the intersection of the leading edge with the background level determines the position of the band offset. 19,22,27,30,163 However, this approximation can lead to erroneous fits in the case of band edges that are not abrupt. In particular, inaccuracies may arise from this method if the density of states at the leading edge is low and there is no distinct tangent to take, as occurs for many PIMs reported.…”
Section: Fitting the Leading Edge In Photoemission Spectroscopy Measumentioning
confidence: 99%
See 3 more Smart Citations
“…In this method, the intersection of the leading edge with the background level determines the position of the band offset. 19,22,27,30,163 However, this approximation can lead to erroneous fits in the case of band edges that are not abrupt. In particular, inaccuracies may arise from this method if the density of states at the leading edge is low and there is no distinct tangent to take, as occurs for many PIMs reported.…”
Section: Fitting the Leading Edge In Photoemission Spectroscopy Measumentioning
confidence: 99%
“…19,27,162 Photoemission spectroscopy is a powerful tool to investigate the band structure of novel semiconductor materials and the position of the Fermi level in the bandgap. The techniques are applicable not only to thin films, 163 but also single crystals, for which band positions need to be precisely known for electrical characterization and device applications. 89,90 XPS, for instance, is not only useful for measuring the chemical composition and composition of materials by evaluating the core level area intensities, it can also be employed to determine the valence band density of states with respect to the Fermi level.…”
Section: Atom Probe Tomography (Apt)mentioning
confidence: 99%
See 2 more Smart Citations
“…The ionization potential of CH 3 NH 3 PbI 3 can be deduced to be 5.71 eV, substantially lower than those obtained from spin cast films whose stoichiometry are known to deviate from ideal. [19,28] The band gap of CH 3 NH 3 PbI 3 was reported to be around 1.55 eV, [28,29] so the prepared film was a slightly n-type film. The XPS core level spectra of the CH 3 NH 3 PbI 3 film before and after exposure to oxygen are shown in Figure 2.…”
mentioning
confidence: 99%