2006
DOI: 10.1088/0957-4484/17/11/002
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Interdigitated 50 nm Ti electrode arrays fabricated using XeF2enhanced focused ion beam etching

Abstract: The fabrication of interdigitated titanium nanoelectrode arrays of 50 nm in width and spacing is described in this work. The nanoarrays have been realized using a Ga + focused ion beam (FIB). FIB milling is typically accompanied by redeposition of removed material, which represents an important hindrance for milling closely spaced nanostructures. Redeposition effects have been reduced by means of XeF 2 gas assistance, which increases the etch yield by a factor of seven compared with pure ion milling. Furthermo… Show more

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Cited by 47 publications
(23 citation statements)
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“…The formation of conical pores by FIB milling has been explained to be caused by redeposition of milled material [ 28 , 29 ]. To address this problem, the use of XeF2-enhanced FIB milling is demonstrated to reduce the effects of material redeposition in the fabrication of inter-digitated nanogap nanoelectrodes [ 30 ]. These nanopore arrays produced by FIB were explored by many groups to mimic cell membrane nanopores and for DNA biosensing applications [ 31 ].…”
Section: Fib Nanopore Fabricationsmentioning
confidence: 99%
“…The formation of conical pores by FIB milling has been explained to be caused by redeposition of milled material [ 28 , 29 ]. To address this problem, the use of XeF2-enhanced FIB milling is demonstrated to reduce the effects of material redeposition in the fabrication of inter-digitated nanogap nanoelectrodes [ 30 ]. These nanopore arrays produced by FIB were explored by many groups to mimic cell membrane nanopores and for DNA biosensing applications [ 31 ].…”
Section: Fib Nanopore Fabricationsmentioning
confidence: 99%
“…Moreover, the fabrication step can be monitored in situ by secondary electron images induced by the FIB [33]. One of the principal applications of FIB is the physical sputtering of material by ion impact for micro-and nano-patterning [35].…”
Section: Focused Ion Beam Lithographymentioning
confidence: 99%
“…The FIB milling technique has been used to create recessed nanopore and nanoband electrodes on oxidized silicon wafer substrates [35,36]. Platinum electrodes (100 nm thick, and typically microbands of 2 mm · 0.6 mm) were initially fabricated using UV lithography, metal deposition and lift-off processes.…”
Section: Focused Ion Beam Lithographymentioning
confidence: 99%
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