Through combined three-dimensional electromagnetic and particle tracking simulations we demonstrate a THz driven electron streak camera featuring a temporal resolution on the order of a femtosecond. The ultrafast streaking field is generated in a resonant THz sub-wavelength antenna which is illuminated by an intense single-cycle THz pulse. Since electron bunches and THz pulses are generated with parts of the same laser system, synchronization between the two is inherently guaranteed. U ltrafast generation of electrons and ultrafast manipulation of their trajectories is a rapidly developing field and is, in most cases, tightly intertwined with ultrafast laser technology. Ultrafast lasers illuminate metallic plane photocathodes or nanotips to produce correspondingly short electron bunches through photo-or field emission. One major driving force behind ultrashort electron pulse generation and measurement developments has been the field of ultrafast electron diffraction in the femtosecond time domain, which has recently been reviewed by Miller 1,2 . Notable work in this field includes studies on chemical reactions in the gas phase 3 , ultrafast melting dynamics of metals 4,5 , ultrafast dynamics in charge density wave materials 6,7 , and insulator to metal phase transitions in organic salts 8 , to name but a few. The success of these experiments has depended heavily on advances in ultrafast electron source technology. In the 10-100 kV electron energy regime, pulsed electron guns based on planar photocathodes are capable of producing electron bunches with pulse durations in the few hundred femtosecond regime 4,9-12 while nanotip sources [13][14][15][16][17] and bunch re-compression based systems 8,[18][19][20] are, at least in principle, capable of reaching the 10-100 fs time domain. Pulsed electron sources in the MeV are expected to have a similar performance in terms of electron pulse duration 21,22 . Full temporal characterization of ultrashort electron wavepackets is a prerequisite for their use not only in ultrafast electron diffraction experiments, but also electron rescattering in atoms, as well as seeding of femtosecond x-ray free electron lasers (XFEL) 23 . This issue is especially acute for systems with non-negligible pulse-to-pulse fluctuations, in which single-shot characterization techniques are required. While temporal characterisation of ultrashort light pulses in the visible and near-visible regime with sub-100 fs precision is routine, measurements of similar precision on ultrashort electron pulses are currently considered a technical challenge. The literature therefore abounds with reports of both conceptual and experimental realizations of temporal electron pulse characterisation in the femtosecond regime. Streak cameras have been applied in the field of ultrafast electron diffraction (UED), initially in single-shot mode, to obtain sub-picosecond pulse duration measurements 5,10 . Subsequently, Kassier et al. demonstrated a low-jitter streak camera suitable for accumulation mode measurements of elec...