Intensity of X-ray Diffraction by an One-Dimensionally Disordered Crystal (1) General derivation in cases of the “Reichweite” S=0 and 1

Kakinoki, Jiro; Komura, Y.

doi:10.1143/jpsj.7.30

Cited by 134 publications

(50 citation statements)

References 4 publications

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“…His result was confirmed by Kakinoki (1965Kakinoki ( , 1969 by use of the matrix method (Hendricks & Teller, 1942;Kakinoki & Komura, 1952, 1954a, b, 1965Kakinoki, 1961Kakinoki, , 1965Kakinoki, , 1966aKakinoki, , 1967.…”

Section: The Gevers Theory (Ii N T-vii) and The S= 2 Theory (V)mentioning

confidence: 84%

A general theory for the diffraction line profiles of h.c.p. and f.c.c. polycrystals containing stacking faults

Sato¹

1969

Acta Cryst Sect A

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Section: The Gevers Theory (Ii N T-vii) and The S= 2 Theory (V)mentioning

confidence: 84%

A general theory for the diffraction line profiles of h.c.p. and f.c.c. polycrystals containing stacking faults

Sato¹

1969

Acta Cryst Sect A

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“…0021-8898/82/050509-04501.00 © 1982 International Union of Crystallography rod the intensity distribution depends on the nature of the layers and on their stacking mode (Hendricks & Teller, 1942;Mrring, 1949;Jagodzinski, 1949;Kakinoki & Komura, 1952, 1954aCowley, 1976a, b;Drits & Sakharov, 1976;Plan¢on & Tchoubar, 1977;Plan¢on, 1981;Sakharov, Naoumov & Drits, 1982).…”

Section: Methodsmentioning

confidence: 99%

Recording and calculation ofhkrod intensities in case of diffraction by highly oriented powders of lamellar samples

Plançon¹,

Rousseaux²,

Tchoubar³

et al. 1982

J Appl Cryst

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The aim of this paper is to describe a technique for recording the intensity distribution along definite crystallographic directions by using a classical 0,20 powder goniometer. This method was developed for application to highly oriented powders. In the calculation of simulated spectra, the partial misorientation of the particles is considered. The reflection intensities and profiles are compared for different shapes of the misorientation function N(~).

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“…In particular, a matrix formalism has been developed to describe the intensity diffracted by a set of crystals containing different layer types both for basal and hkl reflections (Kakinoki and Komura, 1952, 1954a, b, 1965Drits and Sakharov, 1976;Plançon and Tchoubar, 1976;Plançon, 1981Plançon, , 2002Sakharov et al, 1982a, b). In these works it has been systematically assumed that the layers constituting the outer surfaces of the crystals are identical to those in the core of the crystals.…”

Section: Introductionmentioning

confidence: 99%

Influence of the Outer Surface Layers of Crystals on the X-Ray Diffraction Intensity of Basal Reflections

Sakharov

Plançon

Lanson

et al. 2004

Clays and clay miner.

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This study presents a mathematical formalism describing diffraction effects from periodic and mixed-layer minerals in which the outer surface layers of crystals differ from layers forming the core of the crystals. XRD patterns calculated for structure models of chlorite and irregular chlorite-smectites terminated on both sides of the crystals by either brucite-like or 2:1 layers show the strong influence that different outer surface layers make on the distribution of basal reflection intensities. Simulation of the experimental XRD patterns from two chlorite samples having different Fe-content shows that in these two samples the chlorite crystals were terminated by brucite-like layers on both sides. In contrast, crystals in a corrensite sample were terminated by water molecules and exchangeable cations. The nature of diffraction effects due to outer surface layers is discussed.

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Intensity of X-ray Diffraction by an One-Dimensionally Disordered Crystal (1) General derivation in cases of the “Reichweite” S=0 and 1

Cited by 134 publications

References 4 publications

A general theory for the diffraction line profiles of h.c.p. and f.c.c. polycrystals containing stacking faults

A general theory for the diffraction line profiles of h.c.p. and f.c.c. polycrystals containing stacking faults

Recording and calculation ofhkrod intensities in case of diffraction by highly oriented powders of lamellar samples

Influence of the Outer Surface Layers of Crystals on the X-Ray Diffraction Intensity of Basal Reflections

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