“…Because of the practical importance of materials with structures built up of translationally equivalent layers, several theories and methods have been worked out since the early days of X-ray diffraction methods to make possible the characterization of their faulted structures (Warren, 1941;Hendricks & Teller, 1942;Gevers, 1952Gevers, , 1954Kakinoki & Komura, 1952;Paterson, 1952;Johnson, 1963;Allegra, 1964;Sato, 1966Sato, , 1969Kakinoki, 1967;Lele, Anantharaman & Johnson, 1967;Holloway, 1969;Lele, 1969;Lele, Prasad & Anantharaman, 1969;Lele & Rama Rao, 1970;Prasad & Lele, 1971). These methods, however, are all indirect, assuming random distribution of stacking faults.…”