“…Also, the techniques have been used to assess the carrier dynamics such as excited carrier paths towards the lower energy states (e.g., Akiba et al, 2004, Merano et al, 2005, Sonderegger et al, 2006, as well as carrier lifetimes. Some extended defects such as dislocations (Yamamoto et al, 1984, Mitsui & Yamamoto, 1997, twins (Ohno et al, 2007b), platelets (Ohno, 2005a) and strains induced by a uniaxial stress , Ohno, 2005b, as well as low-dimensional nanostructures such as nanowires (Ishikawa et al, 2008, Yamamoto et al, 2006, quantum wells (Ohno, 2005a) and superlattices (Ohno & Takeda, 2002, Ohno et al, 2007b, form anisotropic defect levels, and electronic transitions via the levels result in the emission of polarized CL lights. CL polarization analyses have helped us to assess quantitatively the atomistic structures of such nanostructures and defects.…”