Intelligent Methods for Test and Reliability

Amrouch, H.; Anders, Jens; Becker, St.; Betka, Maik; Bleher, G.; Domanski, Peter; Elhamawy, Nourhan; Ertl, Thomas; Gatzastras, Athanasios; Genßler, Paul R.; Hasler, S.; Heinrich, M.; Hoorn, André van; Jafarzadeh, H.; Kallfass, Ingmar; Klemme, Florian; Koch, Steffen; Küsters, Ralf; Lalama, Andres; Latty, Raphael; Liao, Yi-Wen; Lylina, Natalia; Haghi, Z. Najafi; Pflüger, Dirk; Polian, Ilia; Rivoir, Jochen; Sauer, Matthias; Schwachhofer, Denis; Templin, S.; Volmer, C.; Wagner, Stefan; Weiskopf, Danie; Wunderlich, H.-J.; Yang, Bin; Zimmermann, M.

doi:10.23919/date54114.2022.9774526

2022 Design, Automation &Amp; Test in Europe Conference &Amp; Exhibition (DATE) 2022

DOI: 10.23919/date54114.2022.9774526

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Intelligent Methods for Test and Reliability

H. Amrouch

Jens Anders

St. Becker

et al.

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Optimizing Post-Silicon Validation for FPGA Serial Configuration using an Automation Framework and Timing Characterization Verification

Zainol,

Khamron,

Bin

2023

2023 IEEE International Test Conference in Asia (ITC-Asia)

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Optimizing Post-Silicon Validation for FPGA Serial Configuration using an Automation Framework and Timing Characterization Verification

Zainol,

Khamron,

Bin

2023

2023 IEEE International Test Conference in Asia (ITC-Asia)

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Intelligent Methods for Test and Reliability

Cited by 1 publication

References 17 publications

Optimizing Post-Silicon Validation for FPGA Serial Configuration using an Automation Framework and Timing Characterization Verification

Optimizing Post-Silicon Validation for FPGA Serial Configuration using an Automation Framework and Timing Characterization Verification

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