Optimizing Post-Silicon Validation for FPGA Serial Configuration using an Automation Framework and Timing Characterization Verification

Zainol, Mohd Amiruddin; Khamron, Sompon; Bin, Ng Gua

doi:10.1109/itc-asia58802.2023.10301165

2023 IEEE International Test Conference in Asia (ITC-Asia) 2023

DOI: 10.1109/itc-asia58802.2023.10301165

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Optimizing Post-Silicon Validation for FPGA Serial Configuration using an Automation Framework and Timing Characterization Verification

Mohd Amiruddin Zainol,

Sompon Khamron,

Ng Gua Bin

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Optimizing Post-Silicon Validation for FPGA Serial Configuration using an Automation Framework and Timing Characterization Verification

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References 7 publications

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