2008
DOI: 10.1063/1.2838773
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Integration of magneto-optical active bismuth iron garnet on nongarnet substrates

Abstract: Articles you may be interested inFabrication and characterization of Bismuth-Cerium composite iron garnet epitaxial films for magneto optical applications J. Appl. Phys. 112, 083525 (2012); 10.1063/1.4759355 Comment on "The role of Bi3+ ions in magneto-optic Ce and Bi comodified epitaxial iron garnet films" [Appl.

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Cited by 25 publications
(17 citation statements)
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“…Stadler et al demonstrated the deposition of YIG poly-crystalline thin films on MgO and quartz substrates through a novel reactive sputtering method with rapid thermal annealing [19, 20]. Körner et al [21] deposited a poly-crystalline Bi 3 Fe 5 O 12 layer through pulsed laser deposition (PLD) on SiO 2 with an annealed YIG buffer layer.…”
Section: Magneto-optical Materialsmentioning
confidence: 99%
“…Stadler et al demonstrated the deposition of YIG poly-crystalline thin films on MgO and quartz substrates through a novel reactive sputtering method with rapid thermal annealing [19, 20]. Körner et al [21] deposited a poly-crystalline Bi 3 Fe 5 O 12 layer through pulsed laser deposition (PLD) on SiO 2 with an annealed YIG buffer layer.…”
Section: Magneto-optical Materialsmentioning
confidence: 99%
“…Besides of growing BIG on GGG bulk material it is possible to employ a buffer system on non‐garnet material 7. Two buffer systems based on GGG and YIG were analyzed to optimize the roughness of the garnet stack.…”
Section: Garnet Morphologymentioning
confidence: 99%
“…A buffer system to grow BIG on non‐garnet substrates was developed and characterized. Also the growth mechanisms of BIG films made by pulsed laser deposition (PLD) on silicon, amorphous SiO 2 , gadolinium gallium garnet (GGG) Gd 3 Ga 5 O 12 (001), and (111) substrates have been investigated using in situ reflection high energy electron diffraction (RHEED), transmission electron microscopy (TEM), environmental scanning electron microscopy (ESEM), energy dispersive X‐ray analysis (EDX), atomic force microscopy (AFM), Rutherford backscattering spectroscopy (RBS), and X‐ray diffraction (XRD) measurements 6–9.…”
Section: Introductionmentioning
confidence: 99%
“…However, YIG (and TIG) prove to be relatively straightforward to crystallize into a poly-crystalline form on silicon and many other nongarnet surfaces. By first depositing and annealing a YIG buffer layer, this can be used as a seed layer to subsequently deposit and anneal cerium-substituted [7] or bismuth [24] iron garnets and obtain the desired phase in polycrystalline form. It is observed that a minimum YIG layer thickness of $20 nm is required in order to obtain polycrystalline Ce:YIG [7].…”
Section: Waveguide Simulation and Designmentioning
confidence: 99%