Integrated test facility (ITF)-automation testing to support Intel's manufacturing output

Abstract

manuhcturing output. In 1997, the focus is on supporting current factory capacity (fab ramp to 15,000 WSPW, 0.25 micron process automation development and Year 2000 fix), as well as adding carrridge manufhcturing automation system testing.In parallel, continuous improvement of integrated volume test methodologies is being implemented.Maintaining its position as the world's largest manufacturer of semiconductors, Intel increasingly depends upon automation in manufacturing. As rewarding as this technology is, however, this dependence has a downside. A problem in the automation system may shut down an entire hctory.

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