International Conference on Simulation of Semiconductor Processes and Devices, 2003. SISPAD 2003. 2003
DOI: 10.1109/sispad.2003.1233698
|View full text |Cite
|
Sign up to set email alerts
|

Integrated multiscale multistep process simulation

Abstract: We discuss the integration of process simulations for several process steps in the fabrication of a simple Damascene structure. Starting with a blanket silicon dioxide substrate and a patterned mask, we perform simulations of plasma etching, PVD barrier deposition, PVD seed layer deposition, electrochemical deposition of copper using an additive-containing bath, and chemical mechanical polishing. This virtual process sequence demonstrates the use of process simulation to study not just individual process steps… Show more

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...

Citation Types

0
0
0

Publication Types

Select...

Relationship

0
0

Authors

Journals

citations
Cited by 0 publications
references
References 9 publications
(9 reference statements)
0
0
0
Order By: Relevance

No citations

Set email alert for when this publication receives citations?