Spatial analysis techniques were used to investigate defects and nanostructures in the III-nitride system. Dislocations in GaN films were distributed nonrandomly, forming both short-scale and large-scale linear arrays aligned along h11 " 20i: Both low-density InGaN/GaN quantum dots (QDs) and In droplets on the surface of InAlN films were in spatially random positions and showed no spatial autocorrelation, but high-density InGaN/GaN QDs showed a tendency toward short-range ordering and all features showed a nonrandom size distribution. The spatial arrangements of defects and nanostructures relate to their generation processes and may also affect device properties.