2008
DOI: 10.1016/j.jcrysgro.2008.05.001
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Insights into the growth mechanism of InxGa1−xN epitaxial nanostructures formed using a silane predose

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Cited by 3 publications
(5 citation statements)
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“…The growth conditions of the samples used in the investigation of InGaN QDs produced on the surface of GaN films using a SiH 4 predose are described in Ref. 8, and the growth conditions of the samples used in the investigation of In droplets on InAlN films are described in Ref. 23.…”
Section: Experimental and Data Analysis Methodsmentioning
confidence: 99%
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“…The growth conditions of the samples used in the investigation of InGaN QDs produced on the surface of GaN films using a SiH 4 predose are described in Ref. 8, and the growth conditions of the samples used in the investigation of In droplets on InAlN films are described in Ref. 23.…”
Section: Experimental and Data Analysis Methodsmentioning
confidence: 99%
“…Longer SiH 4 predose times and/or longer QD growth times were found to produce higher QD densities. 8 The precise role of the SiH 4 pretreatment is under debate; while Si was initially thought to act as a surfactant, 31 subsequent studies indicated that it may produce a SiN x layer that acts as a holey ''nanomask,'' 32,33 while others suggested that its role in inducing surface roughening of the GaN was more important. 34 The QDs in samples with the lowest QD densities of 6 9 10 10 cm À2 displayed a spatially random pattern of nucleation (Fig.…”
Section: Ingan/gan Quantum Dotsmentioning
confidence: 99%
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“…Whilst self-assembled InGaN QDs have been grown by molecular beam epitaxy (MBE) via Stranski-Krastanov (SK) growth [7], there are a number of different methods to grow InGaN QDs in metalorganic vapour phase epitaxy (MOVPE), such as pre-treatment of the surface by a silicon precursor [8], and growing InGaN thin films at two different temperatures [9]. Our approach for the growth of InGaN QDs (modified droplet epitaxy) involves a post-growth anneal of the InGaN epilayer at the growth temperature in molecular nitrogen [10].…”
Section: Introductionmentioning
confidence: 99%