2020
DOI: 10.1016/j.apsusc.2020.146535
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Insight into the initial oxidation of UN1.85 thin films

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Cited by 6 publications
(4 citation statements)
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“…Instead, most attention has focused on thorium's bulk properties as a candidate fuel for nuclear reactors. With this objective in mind, films of ThO 2 have been synthesized using sputtering [48, 49], photochemical deposition [32] [80], and (e) an XRD diffraction pattern for UN [103]. The equivalent data for UO 2 come from (f) [104], (g) and (h) [85], (i) [6], (j) [23], and (k) from [85].…”
Section: Thin Film Synthesismentioning
confidence: 99%
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“…Instead, most attention has focused on thorium's bulk properties as a candidate fuel for nuclear reactors. With this objective in mind, films of ThO 2 have been synthesized using sputtering [48, 49], photochemical deposition [32] [80], and (e) an XRD diffraction pattern for UN [103]. The equivalent data for UO 2 come from (f) [104], (g) and (h) [85], (i) [6], (j) [23], and (k) from [85].…”
Section: Thin Film Synthesismentioning
confidence: 99%
“…The data presented in each panel have been digitally extracted from the relevant references and are shown for illustrative purposes only. (a) RBS data from UN before and after radiation exposure ([78]), (b) XPS data for a UN thin film ([53]), (c) SEM micrograph of a UN thin film ([79]), (d) UN Raman spectrum[80], and (e) an XRD diffraction pattern for UN[103]. The equivalent data for UO 2 come from (f)[104], (g) and (h)[85], (i)[6], (j)[23], and (k) from[85].…”
mentioning
confidence: 99%
“…Recent studies point to a lack of evidence favoring any ordered or disordered magnetism in δ-Pu [152], which preferentially forms a valence fluctuation ground state [153]. [72], and (e) an XRD diffraction pattern for UN [93]. The equivalent data for UO2 come from (f) [94], (g) and (h) [76], (i) [3], (j) [19], and (k) from [76].…”
Section: B Magnetic Propertiesmentioning
confidence: 99%
“…The data presented in each panel have been digitally extracted from the relevant references and are shown for illustrative purposes only. (a) RBS data from UN before and after radiation exposure ([70]), (b) XPS data for a UN thin film ( [45]), (c) SEM micrograph of a UN thin film ( [71]), (d) UN Raman spectrum[72], and (e) an XRD diffraction pattern for UN[93]. The equivalent data for UO2 come from (f)[94], (g) and (h)[76], (i)[3], (j)[19], and (k) from[76].…”
mentioning
confidence: 99%