Insight in the outside: New applications of low-energy ion scattering

Low energy ion scattering (LEIS). A practical introduction to its theory, instrumentation, and applications

“…Since only ions are detected in LEIS, and only ions that scatter off of the outermost atomic layer of a material have short enough interaction times to avoid neutralization, LEIS is uniquely sensitive to the atomic composition of the outermost layer of a material. 2,9,16 Indeed, LEIS is so surface sensitive that even a monolayer of contamination, e.g., adventitious carbon, can obscure the signal from a material.…”

“…The rst papers on the double toroidal analyzer (DTA) were published in the 1980s. 4,5,29 This design was rened over the next 20 years, 16 and nally incorporated into a commercial instrument. A schematic representation of a DTA can be seen in Fig.…”

Studies of an surface by low-energy ion scattering

“…a scanning tunneling microscopy (STM), a low-energy electron diffraction (LEED) and an X-ray photoelectron diffraction (XPD) [1][2][3][4][5][6][7]. Among different surface methods, the low-energy ion scattering (LEIS) has been used in a large extent for solid surface analysis [3,8,9]. The majority of the reflected ions are scattered from the outermost surface layer due to a large differential scattering cross-section implying a high surface-sensitivity of the LEIS technique.…”

Adsorption geometry of ethyl iodide on clean and oxygen covered Ru(001) surfaces: LEIS, XPS and TDS study

“…In the present paper the adsorption geometry and the precursor state of C-I bond breaking are discussed on clean and oxygen covered Ru(001) surfaces. Since low energy ion scattering is extremely surface sensitive (monolayer), a low energy ion scattering spectroscopy (LEIS) combined with other surface science tools, could give useful information about the surface processes [15,16].…”