2016
DOI: 10.1039/c6ay00765a
|View full text |Cite
|
Sign up to set email alerts
|

Low energy ion scattering (LEIS). A practical introduction to its theory, instrumentation, and applications

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
2
1
1
1

Citation Types

1
55
0

Year Published

2018
2018
2023
2023

Publication Types

Select...
7
1

Relationship

3
5

Authors

Journals

citations
Cited by 85 publications
(59 citation statements)
references
References 53 publications
1
55
0
Order By: Relevance
“…27,28 The low energy does not allow ions to penetrate too deep into the surface and they mostly collide with atoms on the outermost surface. In LEIS analyses of the corroded ISG samples, sample surfaces were first cleaned by sputtering with a 0.5 keV Ar + beam before being probed by the primary ion beam.…”
Section: Compositional Analysis Of Topmost Surface With Low Energy mentioning
confidence: 99%
See 2 more Smart Citations
“…27,28 The low energy does not allow ions to penetrate too deep into the surface and they mostly collide with atoms on the outermost surface. In LEIS analyses of the corroded ISG samples, sample surfaces were first cleaned by sputtering with a 0.5 keV Ar + beam before being probed by the primary ion beam.…”
Section: Compositional Analysis Of Topmost Surface With Low Energy mentioning
confidence: 99%
“…27,28 The fractured surface that has never been touched with any physical objects or chemicals could be assumed to be the most pristine surface that one can prepare. 27,28 The fractured surface that has never been touched with any physical objects or chemicals could be assumed to be the most pristine surface that one can prepare.…”
Section: Leis Analysis Of the Topmost Layer Of Pristine Isg Surfacesmentioning
confidence: 99%
See 1 more Smart Citation
“…Low-energy ion scattering (LEIS) spectroscopy, also called ion scattering spectroscopy (ISS) can be used to more accurately validate the purity of the catalyst surface since it only probes the top layer of atoms on the sample surface. 42 However, because LEIS is a line-of-sight technique it can be difficult to obtain quantitative information about the relative abundance of constituent elements due to their nonequivalent coverage by adventitious adsorbates, such as ambient oxygen. Despite this, ISS is a very useful analytical technique because of its enhanced sensitivity for detecting impurities on an electrode surface.…”
Section: Iii: Impact Of Impurities On Electrocatalytic Activitymentioning
confidence: 99%
“…This analyzer has been incorporated into an advanced commercial LEIS equipment released in 2008 by ION-TOF GmbH. 278 The so-called high-sensitivity low-energy ion scattering (HS-LEIS), 279 under the commercial name of Qtac 100 , which requires very low ion fluency for the measurement, enables the "static" analysis with negligible damage from the probing ions, and has resulted in better detection limits for the surface elements. For instance, the detection limit for the surface coverage for lighter elements (from Li to O) is ≥ 1% and for heavier elements (from K-U) is between 500 to 10 ppm.…”
Section: High-sensitivity Leis Setupmentioning
confidence: 99%