Infrared spectrometric measurement of impurities in highly enriched ‘Si28’

Zakel, Sabine; Wundrack, Stefan; Niemann, Henning; Rienitz, Olaf; Schiel, Detlef

doi:10.1088/0026-1394/48/2/s02

Cited by 32 publications

(36 citation statements)

References 22 publications

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“…This means that the spheres must be characterized both structurally and chemically so that the appropriate corrections are applied. [16][17][18][19] The mass, thickness, and chemical composition of the surface layers must be taken into account; they are measured by optical and x-ray spectroscopy and reflectometry. 20…”

Section: Measurement Equationmentioning

confidence: 99%

The Correlation of the NA Measurements by Counting 28Si Atoms

Mana

Massa

Sasso

et al. 2015

Journal of Physical and Chemical Reference Data

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An additional value of the Avogadro constant was obtained by counting the atoms in isotopically enriched Si spheres. With respect to the previous determination, the spheres were etched and repolished to eliminate metal contaminations and to improve the roundness. In addition, all the input quantities-molar mass, lattice parameter, mass, and volume-were remeasured aiming at a smaller uncertainty. In order to make the values given in Andreas et al. [Metrologia 48, S1 (2011)] and Azuma et al. [Metrologia 52, 360 (2015)] usable for a least squares adjustment, we report about the estimate of their correlation.

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Section: Measurement Equationmentioning

confidence: 99%

The Correlation of the NA Measurements by Counting 28Si Atoms

Mana

Massa

Sasso

et al. 2015

Journal of Physical and Chemical Reference Data

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“…To complete the N A determination, the Bureau International des Poids et Mesures (BIPM), NMIJ, and PTB determined the ball mass [58], volume [59,60], and chemical [61] and isotopic compositions [55,62], and characterised their surfaces geometrically, chemically, and physically at the atomic scale [63]. The results, which are given in table 6, were used to stipulate the value of the Planck and Avogadro constants in the redefinition of the International System of Units [64].…”

Section: Measuring the Avogadro Constantmentioning

confidence: 99%

The Measurement of the Silicon Lattice Parameter and the Count of Atoms to Realise the Kilogram

Massa

Sasso

Mana

2020

MAPAN

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X-ray interferometry established a link between atomic and macroscopic realisations of the metre. The possibility of measuring the silicon lattice parameter in terms of optical wavelengths opened the way to count atoms, to determine the Avogadro constant with unprecedented accuracy, and, nowadays, to realise the kilogram from the Planck constant. Also, it is a powerful tool in phase-contrast imaging by X-rays and, combined with optical interferometry, in linear and angular metrology with capabilities at the atomic scale. This review tells the history of the development of this fascinating technology at the Istituto Nazionale di Ricerca Metrologica in the last forty years. Eventually, it highlights its contribution to the redefinition of the International System of Units (SI).

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“…Their concentrations are measured by infrared absorption spectroscopy [32]. A typical absorption spectrum is shown in figure 5.…”

Section: Crystal Perfection: Evaluation Of Point Defectsmentioning

confidence: 99%

Realization of the kilogram by the XRCD method

Fujii¹,

et al. 2016

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When the kilogram is redefined in terms of the fixed numerical value of the Planck constant h, the x-ray-crystal-density (XRCD) method, among others, is used for realizing the redefined kilogram. The XRCD method has been used for the determination of the Avogadro constant N A by counting the number of atoms in a 28 Si-enriched crystal, contributing to a substantial reduction of uncertainty in the values of N A and h to 2 parts in 10 8 . This method can be therefore used reversely for the mass determination of a 1 kg sphere prepared from the crystal. This is realized by SI-traceable measurements of its lattice parameter, isotopic composition, volume, and surface properties. Details of the corresponding measurements are provided, as well as the concept of the XRCD method, isotope enrichment, crystal production, sphere manufacturing, and evaluation of impurities and self-point defects in the crystal, together with mass comparison with respect to the silicon sphere for disseminating mass standards.

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Infrared spectrometric measurement of impurities in highly enriched ‘Si28’

Cited by 32 publications

References 22 publications

The Correlation of the NA Measurements by Counting 28Si Atoms

The Correlation of the NA Measurements by Counting 28Si Atoms

The Measurement of the Silicon Lattice Parameter and the Count of Atoms to Realise the Kilogram

Realization of the kilogram by the XRCD method

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