“…Several papers present critical-point analysis for twophonon features in Si and Ge: the works by Johnson, 37 Johnson and Loudon, 42 Balkanski and Nusimovici, 43 Fray et al, 39 Kress, et al, 44 and Ikezawa and Ishigame, 36 indicated by acronyms J, JL, BN, FJQW, KBW, and II in Tables II and III that are discussed below. Johnson's paper contains a fairly thorough review of aspects of critical-point analysis in earlier work.…”