2012
DOI: 10.1364/ol.37.003966
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Infrared imaging using arrays of SiO_2micromechanical detectors

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Cited by 10 publications
(5 citation statements)
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“…Al and SiO x are standard microfabrication materials, and can therefore be easily incorporated into the construction of thermal sensors such as microbolometers or bi-material sensors. 31 If these layers are used in a microbolometer pixel, the thickness of the microbridge could be minimized by placing the resistive layer in the dielectric spacer. Further investigation is needed to determine what impact this will have on absorption.…”
Section: Resultsmentioning
confidence: 99%
“…Al and SiO x are standard microfabrication materials, and can therefore be easily incorporated into the construction of thermal sensors such as microbolometers or bi-material sensors. 31 If these layers are used in a microbolometer pixel, the thickness of the microbridge could be minimized by placing the resistive layer in the dielectric spacer. Further investigation is needed to determine what impact this will have on absorption.…”
Section: Resultsmentioning
confidence: 99%
“…To overcome the limitations and drawbacks of previous CVG designs, we focused on an approach that takes advantage of silicon resonating structures that can be batch-fabricated using relaxed design rules due to the absence of on-chip electronics. Using well-established photolithographic patterning and wafer-scale processing 48 , we implemented resonator geometries compatible with large oscillation amplitudes and, in turn, oscillation velocities. Furthermore, a modular optical readout based on discrete components eliminates potential electronic interference without increased fabrication cost and complexity.…”
Section: Methodsmentioning
confidence: 99%
“…3 Focal plane array of bimaterial cantilevers has noise equivalent temperature difference (NETD) of 50-200 mK, which is comparable to the NETD of the most recent microbolometer IR detectors, 35-200 mK. 1,13,14 Thus, multiple groups have explored the applications of bimaterial cantilevers in portable IR imaging 7,9,15,16 and IR spectroscopic systems. 8,17,18 To make bimaterial cantilever IR detectors practical for applications, despite this progress, it is still necessary to improve their sensitivity.…”
Section: Introductionmentioning
confidence: 99%
“…[1][2][3][4][5][6][7][8][9][10] The bimaterial cantilevers have shown a potential as a novel uncooled IR detector by exhibiting IR sensitivity similar to traditional methods but with lower cost and faster response time ($0.1-1 ms). 1,11,12 Published research has shown that a bimaterial cantilever can detect radiative power of 250 pW/Hz 0.5 at the wavelength of 650 nm, 6 or 1.3 nW/Hz 0.5 at the wavelength of 10 lm. 3 Focal plane array of bimaterial cantilevers has noise equivalent temperature difference (NETD) of 50-200 mK, which is comparable to the NETD of the most recent microbolometer IR detectors, 35-200 mK.…”
Section: Introductionmentioning
confidence: 99%
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