2011
DOI: 10.1063/1.3631785
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Influence of wetting layers and quantum dot size distribution on intermediate band formation in InAs/GaAs superlattices

Abstract: We examine the influence of the wetting layers (WLs) and the quantum dot (QD) size distribution on the sub-bandgap external quantum efficiency (EQE) of QD solar cells. We use a finite-element Schrödinger-Poisson model that considers QD and wetting layer shapes, sizes, and spacings from cross-sectional scanning tunneling and atomic force micrographs. A comparison between experiments and computations reveals an insignificant contribution of the WL to the sub-bandgap EQE and a broadening of sub-bandgap EQE associ… Show more

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Cited by 19 publications
(6 citation statements)
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“…According to ideal theoretical predictions, the IBSC is expected to exhibit extremely high conversion efficiency, >60%, under the maximum concentration and 48.2% under one-sun irradiation5. Substantial progress has been made in this field101112131415161718192021222324252627 since Luque and Martí have proposed this concept of IBSC in 1997 (ref. 5).…”
mentioning
confidence: 99%
“…According to ideal theoretical predictions, the IBSC is expected to exhibit extremely high conversion efficiency, >60%, under the maximum concentration and 48.2% under one-sun irradiation5. Substantial progress has been made in this field101112131415161718192021222324252627 since Luque and Martí have proposed this concept of IBSC in 1997 (ref. 5).…”
mentioning
confidence: 99%
“…Recently, quantum dots have been used to drive the absorption range, extending into the sub‐band gap . The short‐circuit current ( J SC ) is relevant to the dot size, size nonuniformity, shape, and dot materials . In addition, it is also associated with the number of QD layers and the dot volume density .…”
Section: Introductionmentioning
confidence: 99%
“…[10][11][12] Since the carrier depletion occurs primarily for InAs coverage beyond 3 monolayers (ML), it is often attributed to strain relaxation-induced defects which act as carrier traps. 13,14 However, for C-V and scanning capacitance microscopy, n is spatially averaged over 100s of nm 2 and lm 2 , i.e., 10-100 000 QDs. Thus, carrier concentration profiling across a single QD and the surrounding 2D alloy layer, often termed the "wetting layer" (WL), has not been reported.…”
mentioning
confidence: 99%