2017
DOI: 10.1007/s10854-017-7341-4
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Influence of various complexing agents on structural, morphological, optical and electrical properties of electrochemically deposited ZnSe thin films

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Cited by 18 publications
(3 citation statements)
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“…The estimated E g values were close to those of the corresponding bulk band edge of WZ-MSe (1.74 eV M = Cd and 2.7 eV M = Zn) 51,83 and comparable to those of analogous previously reported films (Table S2 and references therein, ESI†). 6,22,45,84–89 As expected, E g values of ternary thin films, 3F and 5F , were slightly higher than those of bulk MSe band gaps due to partial substitution of Se 2− with S 2− anions in the lattice. Additionally, sub-bandgap absorptions were observed in cadmium thin films.…”
Section: Thin Filmssupporting
confidence: 75%
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“…The estimated E g values were close to those of the corresponding bulk band edge of WZ-MSe (1.74 eV M = Cd and 2.7 eV M = Zn) 51,83 and comparable to those of analogous previously reported films (Table S2 and references therein, ESI†). 6,22,45,84–89 As expected, E g values of ternary thin films, 3F and 5F , were slightly higher than those of bulk MSe band gaps due to partial substitution of Se 2− with S 2− anions in the lattice. Additionally, sub-bandgap absorptions were observed in cadmium thin films.…”
Section: Thin Filmssupporting
confidence: 75%
“…They could have been overcome by a high strain lattice due to the Zn-rich content as confirmed by EDX results. 84 The signals appearing around 515 and 665 cm −1 were assigned to second-order scattering processes involving the ZnSe- and ZnS-like (2LO) phonons, respectively. Unfortunately, the signal corresponding to LO ZnSe + LO ZnS in between these values was not clearly observed due to the fluorescence background interference.…”
Section: Thin Filmsmentioning
confidence: 99%
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