2022
DOI: 10.1016/j.measurement.2021.110694
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Influence of thermal disturbances on profilometric measurements of surface asperities

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Cited by 5 publications
(4 citation statements)
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“…Additionally, the influence of disturbances from profilometer construction's susceptibility to changes in the center of gravity position during movements of the X-arm with the measuring tip was examined. This study builds upon and complements research related to errors in contact profilometry [13,14]. Dependencies resulting from thermal expansion directly affect the parametric values of surface geometry texture.…”
Section: Introductionmentioning
confidence: 85%
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“…Additionally, the influence of disturbances from profilometer construction's susceptibility to changes in the center of gravity position during movements of the X-arm with the measuring tip was examined. This study builds upon and complements research related to errors in contact profilometry [13,14]. Dependencies resulting from thermal expansion directly affect the parametric values of surface geometry texture.…”
Section: Introductionmentioning
confidence: 85%
“…Contact methods, with the most common devices being stylus profilometers, use a diamond measurement tip that moves across a surface and records vertical deviations. Although these are well-known methods, they are sensitive to vibrations, noise, and other disturbances [ 8 , 10 , 11 ] as well as thermal effects [ 12 , 13 , 14 , 15 ] and geometric errors in the measurement tip [ 16 , 17 ]. Compared to other methods, they are time-consuming [ 18 ], have low measurement throughput, and require direct contact with the sample, which can cause scratching and damage to the surface being examined [ 19 , 20 ].…”
Section: Introductionmentioning
confidence: 99%
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“…Figure 1 presents a schematic interpretation of the production and measurement process, taking into account the technological [ 26 , 27 , 28 , 29 , 30 , 31 ] and measuring process [ 32 , 33 , 34 , 35 , 36 , 37 , 38 , 39 ], with particular emphasis on the wavelet [ 40 , 41 , 42 , 43 ] and Fourier transformation [ 44 , 45 , 46 , 47 , 48 , 49 ].…”
Section: Introductionmentioning
confidence: 99%