2011
DOI: 10.1016/j.tsf.2010.10.059
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Influence of the surface roughness on the properties of Au films measured by surface plasmon resonance and X-ray reflectometry

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Cited by 12 publications
(12 citation statements)
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“…All of them display characteristic features with the minimum reflectance around 45.5°, indicating the excitation of SPR. These SPR curves can be well fitted by treating Au film as a homogenous layer with adjustable index[55][56][57][58]. The obtained refractive index (RI) of the Au films are included in the figures, they are close to each other and fall within the typical index range of Au[58][59][60], indicating a successful modeling of Au film SPR.…”
mentioning
confidence: 62%
“…All of them display characteristic features with the minimum reflectance around 45.5°, indicating the excitation of SPR. These SPR curves can be well fitted by treating Au film as a homogenous layer with adjustable index[55][56][57][58]. The obtained refractive index (RI) of the Au films are included in the figures, they are close to each other and fall within the typical index range of Au[58][59][60], indicating a successful modeling of Au film SPR.…”
mentioning
confidence: 62%
“…However, the peak-to-valley surface roughness can reach a value of 10 nm (average height of ~ 4.3 nm) for the same scan area (Supplementary Data, Fig. S2), which can cause multiple light scattering effects from the arbitrarily rough surface (Raether 1988) and thus affect the sensitivity (Velinov et al 2010). …”
Section: Resultsmentioning
confidence: 99%
“…The period of the reflectivity oscillations ("Q z ) indicates the thickness of the layer (t), while the "Q z value is defined as "Q z µ 2³/t. 19) Because the "Q z value of the type-A sample was larger than that of the type-B sample, the thickness of the SiO 2 layer in the type-A sample was determined to be lower than that of the SiO 2 layer in the type-B sample. The critical wave vector for the total external reflection (Q c ), which is defined as Q c = 4(³μ) 1/2 (μ represents the SLD), 20) was observed around Q z = 0.01 (¡…”
Section: Neutron Reflectivity Analysis Of Sio 2 (Phps)/simentioning
confidence: 99%