1999
DOI: 10.1016/s0042-207x(98)00321-2
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Influence of the doping and annealing atmosphere on zinc oxide thin films deposited by spray pyrolysis

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Cited by 79 publications
(32 citation statements)
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“…It has therefore been suggested that thermal treatments lead to desorption of oxygen acceptor states at the surface or at grain boundaries, which act as electron traps to lower charge mobility. 19 Finally annealing in hydrogen or partial vacuum may facilitate hydrogen doping, where hydrogen acts exclusively as a shallow donor. 13 Indeed one or all of these defect species may contribute to the enhanced conductivity of ZnO post anneal.…”
Section: Introductionmentioning
confidence: 99%
“…It has therefore been suggested that thermal treatments lead to desorption of oxygen acceptor states at the surface or at grain boundaries, which act as electron traps to lower charge mobility. 19 Finally annealing in hydrogen or partial vacuum may facilitate hydrogen doping, where hydrogen acts exclusively as a shallow donor. 13 Indeed one or all of these defect species may contribute to the enhanced conductivity of ZnO post anneal.…”
Section: Introductionmentioning
confidence: 99%
“…The electrical resistivity of ZnO thin film is readily modified by the addition of impurity or the post-deposition annealing [1][2][3]. Aluminum oxide doped Zinc oxide (AZO) thin films have been prepared by thermal evaporation [4,5], chemical vapour deposition (CVD) [6], plasma enhanced chemical vapour deposition (PECVD) [7], sol-gel [8,9], spray pyrolysis [10][11][12], pulsed laser deposition (PLD) [13], magnetron sputtering [14][15][16][17][18][19] methods, etc. Magnetron reactive sputtering, using a Zn-Al alloy target, has advantages in target fabrication and film deposition rate [18].…”
Section: Introductionmentioning
confidence: 99%
“…A comprehensive review of our results of the fabrication, post-deposition annealing at different conditions and their effects on the optical and electronic properties will be given in this paper. There has been research concerning the influence of substrate temperature, sputtering power, sputtering pressure (argon pressure), target to substrate distance, and post-deposition annealing in air, argon, or reducing gas on AZO film quality [11,12,18,19]. The structure and physical properties of aluminum-doped zinc oxide transparent thin films synthesized by the thermal evaporation method, sol-gel technique, spray pyrolysis method, RF sputtering method, and subsequently annealed in vacuum, respectively, have been studied [4,9,10,20].…”
Section: Introductionmentioning
confidence: 99%
“…This improvement can be associated with a higher carrier injection through the Al-ZnO (metal-semiconductor) interface. Nunes et al [6,18,19] reported that this is due to desorption of oxygen present at the grain boundaries. As result of this oxygen loss, there is an increase in the effective carrier concentration near to the Al-ZnO interface.…”
Section: Thermal Annealing Effectsmentioning
confidence: 99%