Influence of Substitutions on Ferrimagnetic Ordering of Nickel Ferrites

Abstract

physF sttF solF @A ISWD RWU @IWWUA ujet lssifitionX USFQHFrxY USFSHFqgY IIFP snfluene of ustitutions on perrimgneti yrdering of xikel perrites I hF ldikov @A nd vF slkov @A @A gentrl vortory of iletrohemil ower ouresD fulgrin edemy of ienesD IH edF qF fonhev strFD fqEIIIQ ofiD fulgri @A heprtment of emiondutorsD snstitute of ghemil ehnologyD V ulF yhridski fldFD fqEIUST ofiD fulgri @eeived ytoer UD IWWTA he influene of single nd simultneous sustitution with n nd el on mgneti ordering in nikel ferrites hs een investigted y the sttistis of superexhnge intertions developed y qilleoF he dditionl mgneti wekening due to the mgneti ions exluded from prtiiption in ferriE mgnetism hs een inludedF e liner dependene etween the sturtion mgnetiztion nd the lulted mgneti moment hs een foundD whih onfirmed the ppliility of the sttistil pproh for the quntittive desription of ferrimgneti ordering in the investigted systemF

Studies of the pulse charge of lead-acid batteries for PV applications

“…The DIA is a tool for numerical analysis of the EIS developed recently by Stoynov [21][22][23][24][25] and applied successfully in various electrochemical studies [26][27][28][29][30][31][32]. In the DIA, the usual set of impedance data {ω i , Z i , Z i } is extended with two more parameters to {ω i , Z i , Z i , (dZ /dω) i , (dZ /dω) i } where ω is the AC frequency, Z i and Z i are the real and the imaginary part of the impedance.…”

Secondary differential impedance analysis – a tool for recognition of CPE behavior

“…The impedance diagrams in Figs. 8(a) and 9(a) present the frequency segments corresponding to the bulk properties [3,4]. The temporal plots of YIG show a lack of frequency dependence ( Fig.…”

“…Differential impedance analysis (DIA) is an advanced technique for impedance data analysis [1][2][3][4][5][6], which follows the approach of the structural identification, widely applied in technical cybernetics. The method increases the objectivity and exactness of the model recognition, since it eliminates the necessity of an initial working hypothesis and performs the structural and parametric identification directly from the experimental data.…”

Time−Difference Impedance Spectroscopy of Growing Films Containing a Single Mobile Charge Carrier, with Application to Surface Films on Li Electrodes

“…One should mention an approach with a similar name, “ differential impedance analysis/spectroscopy ”, derived by Stoynov et al − which represents a general method of extracting the system parameters from experimental impedance data, i.e., addressed to quite a different problem.…”