Physical phenomena such as energy quantization have to-date been overlooked in solutionprocessed inorganic semiconducting layers, owing to heterogeneity in layer thickness uniformity unlike some of their vacuum-deposited counterparts. Recent reports of the growth of uniform, ultra-thin (<5 nm) metal-oxide semiconductors from solution, however, have potentially opened the door to such phenomena manifesting themselves. Here, we develop a theoretical framework for energy quantization in inorganic semiconductor layers with appreciable surface roughness, as compared to the mean layer thickness, and present experimental evidence of the existence of quantized energy states in spin-cast layers of zinc oxide (ZnO). As-grown ZnO layers are found to be remarkably continuous and uniform with controllable thicknesses in the range 2-20 nm and exhibit a characteristic widening of the energy band gap with reducing thickness in agreement with theoretical predictions. Using sequentially spin-casted layers of ZnO as the bulk semiconductor and quantum well materials, and gallium oxide or organic self-assembled monolayers as the barrier materials, we demonstrate two terminal electronic devices the current-voltage characteristics of which resemble closely those of double-barrier resonant-tunneling diodes. As-fabricated alloxide/hybrid devices exhibit a characteristic negative-differential conductance region with peak-to-valley ratios in the range 2 -7.