1992
DOI: 10.1016/0022-0248(92)90302-y
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Influence of MOVPE growth conditions and CCl4 addition on InP crystal shapes

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Cited by 23 publications
(5 citation statements)
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“…In Ref. 2 Nordell and coauthors used a modified Wulff diagram to roughly describe the final growth shape on masked structures. In general the Wulff construction agrees with the crystal shape when growth is limited by surface kinetics but disagrees when surface migration is significant or when the supply of reactants is inhomogeneous.…”
Section: Resultsmentioning
confidence: 99%
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“…In Ref. 2 Nordell and coauthors used a modified Wulff diagram to roughly describe the final growth shape on masked structures. In general the Wulff construction agrees with the crystal shape when growth is limited by surface kinetics but disagrees when surface migration is significant or when the supply of reactants is inhomogeneous.…”
Section: Resultsmentioning
confidence: 99%
“…If the lengths of the {111} confining planes are longer than the surface diffusion lengths of the indium reactants on these planes, a saturation in overshooting growth rate may occur if the gas-phase gradient is constant all over the structure. In reality the gas-phase concentration becomes higher with its position above the mesa 2,6 and the overshot rate will continue to increase.…”
Section: Resultsmentioning
confidence: 99%
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“…Improvements concerning selectivity and planarity in regrowth around ridges could be achieved by injecting CCl4 during the MOVPE growth process (9). Excellent surface morphology of MOVPE regrowth of GaInAsP has been achieved around circular ridges (diameter: 100 v m ) etched in InP heterostructures for circular DFB laser applications (10).…”
Section: Embedded Sae This Technique Finds Its Application In Lateralmentioning
confidence: 99%