Selective growth of Fe‐doped InP around masked, nonplanar structures has been studied using low‐pressure pulsed metallorganic epitaxy (PME). The structures, which are etched by a combination of reactive ion etching and wet chemical etching, have a mask overhang length of less than 0.5 μm and a mesa height of 2–3 μm. We show that it is possible to obtain a planar growth surface on a “nonre‐entrant” etched profile using low‐pressure PME, at a growth temperature of 630°C. The growth behavior has been influenced by the stripe orientations, the etched profiles, and the growth temperature. A plane overshooting phenomenon is observed and discussed in terms of a surface migration mechanism. This new growth technique has been used in device fabrication. © 1999 The Electrochemical Society. All rights reserved.