Cavity
mode-matching InGaN resonant-cavity light-emitting diodes
(RC-LEDs) with aperture size-dependent emission have been demonstrated
through nitrogen ion (N+) implantation and electrochemical
wet etching processes. The RC-LED structure consisted of 570 nm-depth
ion-implanted regions and an embedded 17-pair nanoporous-GaN/n-GaN
distributed Bragg reflector (DBR) outside the aperture, while there
existed a full 20-pair DBR structure within the aperture regions.
Shorter and mode-matching cavity lengths were fabricated, confirmed
by transmission electron microscopy and angle-resolved photoluminescence
spectra inside the aperture area without subjecting to the N+ implantation. By reducing the aperture sizes, higher current density
and narrower far-field electroluminescence emission patterns were
observed in the RC-LED with an aperture size of 40 μm-diameter.
These results demonstrate that the cavity mode-matching RC-LEDs with
optical/electrical confinements and controllable cavity length mismatch
features can be applied in a wide range of optoelectronic-based device
applications.