2016
DOI: 10.12693/aphyspola.130.463
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Influence of Growth Conditions of Hydrogenated Amorphous Silicon Carbide on Optical Properties of the Interfacial Layer in SiC-Based Photodevice

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Cited by 3 publications
(2 citation statements)
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“…Figure 4 depicts the diffuse reflectance spectrum where (F (R)E) 1/2 versus E is plotted and the band gap energy estimated is 3.05 eV approximately corresponds to 406 nm of wavelength. This band gap energy is closer to the band gap energy of the SiC of polytype 6H-SiC [16,17]. This justifies the use of 365 nm (3.47 eV) UV light as incident radiation for 6H-SiC in our study which is capable of promoting the electron from the valance to conduction band and thereby triggering photoreduction process.…”
Section: Characterization Of Catalyst Semiconductor Materialssupporting
confidence: 63%
“…Figure 4 depicts the diffuse reflectance spectrum where (F (R)E) 1/2 versus E is plotted and the band gap energy estimated is 3.05 eV approximately corresponds to 406 nm of wavelength. This band gap energy is closer to the band gap energy of the SiC of polytype 6H-SiC [16,17]. This justifies the use of 365 nm (3.47 eV) UV light as incident radiation for 6H-SiC in our study which is capable of promoting the electron from the valance to conduction band and thereby triggering photoreduction process.…”
Section: Characterization Of Catalyst Semiconductor Materialssupporting
confidence: 63%
“…The performance and stability of MS is of great importance for the electronic devices [4][5][6]. MS contacts have an important role in the development of semiconductor industry, due to their applications in various electronic and optoelectronic devices [7].…”
Section: Introductionmentioning
confidence: 99%