“…[49] Currently, the model cannot quantitatively explain the experimentally determined high μ values, especially at N values greater than 1 Â 10 19 cm À3 ; however, a more in-depth understanding of acoustic deformation potential scattering, polar optical phonon scattering, and ionized impurity scattering in these materials was achieved. [49,53,57] In this study, to clarify the commonalities and disparities between the two types of In 2 O 3 films with high μ, we fabricated poly-In 2 O 3 , In 2 O 3 :W, and In 2 O 3 :Ce films in the as-deposited state and spc-In 2 O 3 :H, In 2 O 3 :W,H, and In 2 O 3 :Ce,H films and evaluated their structural, electrical, and optical properties. All of the films were deposited using an RPD system, and the deposition conditions were fixed as much as possible (except for variables such as the dopant species and concentrations, substrate temperatures, and H 2 O vapor pressures during growth) to minimize fluctuations in film properties as a consequence of changes in the experimental conditions.…”